ClassID:

190118

G06F11/2635 - CPC Classification

Classification description:

Error detection; Error correction; Monitoring; Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing; Functional testing; Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers using a storage for the test inputs, e.g. test ROM, script files

Recent Application in this class:
#1
20260030127
2026-01-29

FIRMWARE MANAGEMENT FOR MEMORY SYSTEMS

#2
20250363027
2025-11-27

SYSTEMS AND METHODS FOR HANDLING STORAGE DEVICE DIAGNOSTICS IN AN INFORMATION HANDLING SYSTEM

#3
20250258745
2025-08-14

COMPONENT TESTING USING LOG EVENTS

#4
20240419567
2024-12-19

Simulator application on mobile device for integration testing

#5
20240273000
2024-08-15

Testing drives in a redundant array of independent disks (raid)

#6
20240248823
2024-07-25

Controller, storage device and test system

#7
20240160543
2024-05-16

DATAPATH INTEGRITY TESTING, VALIDATION AND REMEDIATION

#8
20240143467
2024-05-02

METHOD AND SYSTEM FOR FIRMWARE FUNCTIONALITY TESTING OF GAS DETECTOR DEVICES

#9
20230146534
2023-05-11

Managing memory in an electronic system

#10
20230111796
2023-04-13

Predicting which tests will produce failing results for a set of devices under test based on patterns of an initial set of devices under test

#11
20230081687
2023-03-16

Measuring driving model coverage by microscope driving model knowledge

#12
20220405179
2022-12-22

Memory controller, test device and link identification method

#13
20210397527
2021-12-23

Self-healing computing device

#14
20210325460
2021-10-21

Electrical testing apparatus for spintronics devices

#15
20210318946
2021-10-14

Generation of code coverage information during testing of a code sequence

#16
20210073110
2021-03-11

Authoring automated test suites using artificial intelligence

#17
20210072305
2021-03-11

ONLINE TEST DATA RECORD AND OFFLINE DATA CONVERSION ANALYSIS SYSTEM, AND METHOD

#18
20210042204
2021-02-11

TESTING APPARATUS, TESTING SYSTEM, AND NON-TRANSITORY TANGIBLE MACHINE-READABLE MEDIUM THEREOF FOR TESTING TOUCH MOBILE DEVICES

#19
20200117564
2020-04-16

Test controller for concurrent testing of an application on multiple devices without using pre-recorded scripts

#20
20200116790
2020-04-16

Electrical testing apparatus for spintronics devices

#21
20200097350
2020-03-26

VISUAL TIMELINE BASED SYSTEM TO RECOMMEND POTENTIAL ROOT CAUSE OF FAILURE AND REMEDIATION OF AN OPERATION USING CHANGE MANAGEMENT DATABASE

#22
20190278679
2019-09-12

Method, system and apparatus for assessing application impact on memory devices

#23
20190257881
2019-08-22

Electrical testing apparatus for spintronics devices

#24
20190251011
2019-08-15

Controller with ROM, operating method thereof and memory system including the controller

#25
20190050315
2019-02-14

Efficient testing of direct memory address translation

#26
20190050314
2019-02-14

Efficient testing of direct memory address translation

#27
20180246795
2018-08-30

System and method for simulation results analysis and failures debug using a descriptive tracking header

#28
20180240533
2018-08-23

Memory test apparatus

#29
20180210827
2018-07-26

APPARATUS, A SYSTEM, A METHOD AND A COMPUTER PROGRAM FOR ERASING DATA STORED ON A STORAGE DEVICE USING A SEQUENCE OF UNCOMPRESSIBLE DATA

#30
20180189159
2018-07-05

Blade centric automatic test equipment system

#31
20180189158
2018-07-05

Blade centric automatic test equipment system

#32
20180188325
2018-07-05

Blade centric automatic test equipment system

#33
20180157567
2018-06-07

Replicating test case data into a cache with non-naturally aligned data boundaries

#34
20180129577
2018-05-10

Testing speculative instruction execution with test cases placed in memory segments with non-naturally aligned data boundaries

#35
20180113774
2018-04-26

Universal automated testing of embedded systems

#36
20180067794
2018-03-08

Secure tunneling access to debug test ports on non-volatile memory storage units

#37
20180039546
2018-02-08

Systems and methods for secure recovery of host system code

#38
20180019021
2018-01-18

Replicating test case data into a cache and cache inhibited memory

#39
20180018250
2018-01-18

Persistent command parameter table for pre-silicon device testing

#40
20170351599
2017-12-07

Automatically rerunning test executions

#41
20170329688
2017-11-16

Replicating test code and test data into a cache with non-naturally aligned data boundaries

#42
20170300251
2017-10-19

Systems and methods to provide security to one time program data

#43
20170270021
2017-09-21

REPAIR OF FAILED FIRMWARE THROUGH AN UNMODIFIED DUAL-ROLE COMMUNICATION PORT

#44
20170220442
2017-08-03

Replicating test case data into a cache with non-naturally aligned data boundaries

#45
20170168841
2017-06-15

Hardware power-on initialization of an SoC through a dedicated processor

#46
20170139798
2017-05-18

Mobile device and chassis with contactless tags to diagnose hardware and software faults

#47
20170103008
2017-04-13

Efficiency of cycle-reproducible debug processes in a multi-core environment

#48
20170083393
2017-03-23

Secure tunneling access to debug test ports on non-volatile memory storage units

#49
20170060716
2017-03-02

Persistent command parameter table for pre-silicon device testing

#50
20160378633
2016-12-29

REPAIR OF FAILED FIRMWARE THROUGH AN UNMODIFIED DUAL-ROLE COMMUNICATION PORT

#51
20160364308
2016-12-15

Providing autonomous self-testing of a processor

#52
20160274988
2016-09-22

Instruction provider and method for providing a sequence of instructions, test processor and method for providing a device under test

#53
20160259701
2016-09-08

Using values of multiple metadata parameters for a target data record set population to generate a corresponding test data record set population

#54
20160239359
2016-08-18

Persistent command parameter table for pre-silicon device testing

#55
20160224440
2016-08-04

Semiconductor memory device, memory system including the same, and operating method thereof

#56
20160224413
2016-08-04

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CHECKING OPERATION STATE THEREOF

#57
20160172055
2016-06-16

Combined rank and linear address incrementing utility for computer memory test operations

#58
20160117245
2016-04-28

Apparatus, a system, a method and a computer program for erasing data stored on a storage device using a sequence of uncompressible data

#59
20160092332
2016-03-31

Controlling a byte code transformer on detection of completion of an asynchronous command

#60
20160070329
2016-03-10

Memory system

#61
20150293828
2015-10-15

TESTING APPARATUS, TESTING SYSTEM AND TESTING METHOD THEREOF

#62
20150278057
2015-10-01

System and method for supporting a testing framework for an event processing system using multiple input event streams

#63
20150269018
2015-09-24

Fault testing in storage devices

#64
20150262706
2015-09-17

Combined rank and linear address incrementing utility for computer memory test operations

#65
20150253379
2015-09-10

System and method for cloud testing and remote monitoring of integrated circuit devices

#66
20150221396
2015-08-06

Method of testing coherency of data storage in multi-processor shared memory system

#67
20150067407
2015-03-05

ELECTRONIC DEVICE AND METHOD FOR TESTING STORAGE SYSTEM

#68
20150026519
2015-01-22

SERIAL ATTACHED SMALL COMPUTER SYSTEM INTERFACE EXPANDER AND DEBUGGING METHOD

#69
20140365827
2014-12-11

Architecture for end-to-end testing of long-running, multi-stage asynchronous data processing services

#70
20140359361
2014-12-04

Test system

#71
20140304556
2014-10-09

Performing automated system tests

#72
20140280920
2014-09-18

Method and system for remotely monitoring device status and internet connectivity on a computer network

#73
20130346820
2013-12-26

Embedded processor

#74
20130326275
2013-12-05

Hardware platform validation

#75
20130166243
2013-06-27

TEST DEVICE AND METHOD FOR TESTING STABILITY OF ELECTRONIC DEVICES

#76
20120221911
2012-08-30

Embedded processor

#77
20120221903
2012-08-30

TESTING METHOD, NON-TRANSITORY, COMPUTER READABLE STORAGE MEDIUM AND TESTING APPARATUS

#78
20110185240
2011-07-28

Embedded processor

#79
20100095168
2010-04-15

Embedded processor

#80
20070294560
2007-12-20

Support self-heal tool

#81
20070245175
2007-10-18

Method of, apparatus and graphical user interface for automatic diagnostics

#82
20070239288
2007-10-11

POWER SYSTEM AND WORK FLOW THEREOF

#83
20060069950
2006-03-30

System and method for testing computing devices

#84
20050210348
2005-09-22

Microcomputer and method of testing same

#85
15849597
2019-01-01

Efficient testing of direct memory address translation

#86
15675717
2019-01-01

Efficient testing of direct memory address translation

#87
14968466
2017-05-02

Signature-based sleep recovery operation flow

#88
13718295
2020-06-09

Method and system for implementing automated test and retest procedures in a virtual test environment