ClassID:

191670

G06F2217/70 - CPC Classification

Classification description:

Recent Application in this class:
#1
20200019666
2020-01-16

Method and system for latch-up prevention

#2
20190384875
2019-12-19

SYSTEM AND METHOD FOR SELF-HEALING OF A DYNAMIC LINK

#3
20190332724
2019-10-31

3D model validation and optimization system and method thereof

#4
20190332723
2019-10-31

3D MODEL VALIDATION AND OPTIMIZATION SYSTEM AND METHOD THEREOF

#5
20190266305
2019-08-29

Placement-driven generation of error detecting structures in integrated circuits

#6
20190205489
2019-07-04

System and method for isolating faults in a resilient system

#7
20190121925
2019-04-25

3D tolerance analysis system and methods

#8
20190095298
2019-03-28

Automated analog fault injection

#9
20180203968
2018-07-19

Placement-driven generation of error detecting structures in integrated circuits

#10
20180203963
2018-07-19

Three-dimensional NoC reliability evaluation

#11
20170255741
2017-09-07

Skeleton I/O generation for early ESD analysis

#12
20170212972
2017-07-27

Low power VLSI designs using circuit failure in sequential cells as low voltage check for limit of operation

#13
20170193142
2017-07-06

Dynamic link serialization in network-on-chip

#14
20170046472
2017-02-16

COMPUTER-READABLE STORAGE MEDIUM HAVING ELECTRO-STATIC DISCHARGE VERIFICATION PROGRAM STORED THEREIN, INFORMATION PROCESSING APPARATUS, AND METHOD OF VERIFYING ELECTRO-STATIC DISCHARGE

#15
20160266836
2016-09-15

System and method for configuring a plurality of registers with soft error detection and low wiring complexity

#16
20160085605
2016-03-24

Soft-error-rate calculating device

#17
20160063172
2016-03-03

Connectivity-aware layout data reduction for design verification

#18
20150331040
2015-11-19

Integrated circuit device, safety circuit, safety-critical system and method of manufacturing an integrated circuit device

#19
20140289686
2014-09-25

Single event upset mitigation for electronic design synthesis

#20
20140077854
2014-03-20

Sequential state elements radiation hardened by design

#21
20130332776
2013-12-12

Fault tree system reliability analysis system, fault tree system reliability analysis method, and program therefor

#22
20130305199
2013-11-14

In-place resynthesis and remapping techniques for soft error mitigation in FPGA

#23
20130212414
2013-08-15

Reducing performance degradation in backup semiconductor chips

#24
20130132056
2013-05-23

Simulation apparatus and simulation method for determining soft error rates for a configured model

#25
20120266033
2012-10-18

Providing test coverage of integrated ECC logic en embedded memory

#26
20100325599
2010-12-23

Visualization of tradeoffs between circuit designs

#27
14252752
2017-02-28

Configurable register circuitry for error detection and recovery