ClassID:

191673

G06F2217/76 - CPC Classification

Classification description:

Recent Application in this class:
#1
20200151294
2020-05-14

Method for generating aging model and manufacturing semiconductor chip using the same

#2
20190278881
2019-09-12

Age estimator for safety monitoring based on local detectors

#3
20190258773
2019-08-22

Method and system for determining circuit failure rate

#4
20190212248
2019-07-11

RECORDING MEDIUM RECORDING DISTORTION CALCULATION PROGRAM, DISTORTION CALCULATION METHOD, AND INFORMATION PROCESSING APPARATUS OF CALCULATING DISTORTION

#5
20190155972
2019-05-23

METHOD FOR PREDICTING THE BEHAVIOUR OF A PRODUCT WITH RESPECT TO FAILURES THEREOF

#6
20170337298
2017-11-23

Probabilistic evaluation of fastener degradation in nuclear power plants

#7
20170293712
2017-10-12

Probabilistic load and damage modeling for fatigue life management

#8
20170206295
2017-07-20

Method for determining system reliability of a logic circuit

#9
20170161965
2017-06-08

Distributed vehicle health management systems

#10
20170147738
2017-05-25

Method and system for determining circuit failure rate

#11
20170047920
2017-02-16

Aging-based leakage energy reduction method and system

#12
20160259875
2016-09-08

Pattern matching techniques in analog and mixed signal circuits

#13
20160086884
2016-03-24

Mitigating electromigration effects using parallel pillars

#14
20160078157
2016-03-17

Age estimator for safety monitoring based on local detectors

#15
20160004809
2016-01-07

Power rail for preventing DC electromigration

#16
20150162199
2015-06-11

Aging-based leakage energy reduction method and system

#17
20150135809
2015-05-21

Erosion prediction method, erosion prediction system, erosion characteristics database used in this prediction, and method for constructing the same

#18
20150095864
2015-04-02

Power rail for preventing DC electromigration

#19
20150040092
2015-02-05

Stress migration mitigation

#20
20140358500
2014-12-04

Probabilistic high cycle fatigue (HCF) design optimization process

#21
20140350904
2014-11-27

Component fracture evaluation device, component fracture evaluation method and computer program

#22
20140252644
2014-09-11

Mitigating electromigration effects using parallel pillars

#23
20140130598
2014-05-15

Method of carrying out a vibratory fatigue test of a mechanical part

#24
20140100827
2014-04-10

Construction of entropy-based prior and posterior probability distributions with partial information for fatigue damage prognostics

#25
20140068298
2014-03-06

System and process for accounting for aging effects in a computing device

#26
20140025363
2014-01-23

Systems and methods for predicting failures in power systems equipment

#27
20130304449
2013-11-14

System and method of electromigration avoidance for automatic place-and-route

#28
20130278270
2013-10-24

Expected battery life determination systems and methods

#29
20130231898
2013-09-05

System and method for structural analysis

#30
20130138407
2013-05-30

Usage-based temporal degradation estimation for memory elements

#31
20130138403
2013-05-30

Usage-based temporal degradation estimation for memory elements

#32
20130073223
2013-03-21

Turbine-to-turbine prognostics technique for wind farms

#33
20130013272
2013-01-10

Asphalt composition

#34
20120185224
2012-07-19

Systems and methods for material life prediction

#35
20120158392
2012-06-21

Semiconductor sensor reliability

#36
20120095731
2012-04-19

Method for analyzing growth of void of resin in a porous material

#37
20120084065
2012-04-05

Wear-out detection methods for printed circuit board assembly components used in downhole oilfield environments

#38
20110313735
2011-12-22

Circuit device reliability simulation system

#39
15470727
2019-01-15

Scheduling parallel processing of multiple partitions for signal electromigration analysis

#40
15470722
2019-01-29

Pseudo-inverter configuration for signal electromigration analysis

#41
15470712
2019-03-19

Exhaustive input vector stimuli for signal electromigration analysis

#42
13775593
2014-04-29

Managing aging of silicon in an integrated circuit device