197771 ⎘
Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor; Structure or manufacture of heads, e.g. inductive using thin films; Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers Testing or indicating in relation thereto, e.g. before the fabrication is completed
Slider with bond pad arrangements
#2One or more sliders that include a protective overcoat that extends across the entire air bearing surface
#3Method of processing a slider
#4Process coupons used in manufacturing flexures
#5Method of making a high density slider clamp fixture
#6Articles for lapping stacked row bars having in-wafer ELG circuits
#7Method of processing a slider
#8High density slider clamp fixture
#9Selectable readers for better performance
#10Methods and articles for lapping stacked row bars having in-wafer ELG circuits
#11Stripe height lapping control structures for a multiple sensor array
#12Process coupons used in manufacturing flexures
#13Method of manufacturing magnetic recording head
#14Methods of manufacturing magnetic heads using a trigger reader electronic lapping guide
#15De-swage machine for removal of a head from a head stack assembly and method of using the same
#16PROBE TIP STRUCTURE FOR BONDINGLESS ELECTRONIC LAPPING GUIDE CONNECTIONS
#17Method of adjusting tilt using magnetic erase width feedback
#18Methods and systems for detecting ESD events in cabled devices
#19COUPLED SPOT-SIZE-CONVERTER ARRAYS FOR WAFER-LEVEL OPTICAL METROLOGY
#20Apparatus with a lapping guide within a span of the transducer array
#21Alignment of optical components
#22De-swage machine for removal of a head from a head stack assembly and method of using the same
#23Method of manufacturing an electronic device
#24Common ground for electronic lapping guides
#25Spectral noise analysis for read head structures
#26Method and system for performing on-wafer testing of heads
#27Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus
#28Method of manufacturing a thermally-assisted magnetic recording head that suppresses protrusion of a plasmon generator
#29Silver alloy electrical lapping guides (ELGs) for fabrication of disk drive sliders with magnetoresistive sensors
#30Magnetically biased write pole
#31Method of manufacturing magnetoresistive element
#32Thin-femto magnetic head slider and method for producing the same
#33Method and system for optically coupling a laser with a transducer in an energy assisted magnetic recording disk drive
#34Method for determining a critical dimension at a plane of interest from a measurement taken at a test plane
#35Method of burn-in testing for thermally assisted head
#36Method for performing burn-in test
#37Thermally-assisted magnetic recording head having dummy waveguides for light beam alignment
#38Perpendicular magnetic write head having a novel shield structure
#39Magnetic write head fabrication with integrated electrical lapping guides
#40Methods and systems for detecting ESD events in cabled devices
#41Method of Manufacturing Lapping Plate, and Method of Manufacturing Magnetic Head Slider using the Lapping Plate
#42Magnetic head slider testing method
#43Near-field light generating device including near-field light generating element disposed over waveguide with buffer layer and adhesion layer therebetween
#44Device for transporting magnetic head, device for inspecting magnetic head, and method for manufacturing magnetic head
#45Manufacturing method of thin-film magnetic head, wafer for thin-film magnetic head and thin-film magnetic head
#46Electrical lap guides and methods of using the same
#47Testing method of wafer with thin-film magnetic heads and manufacturing method of thin-film magnetic head
#48PATTERNED MAGNETIC RECORDING HEAD WITH TERMINATION PATTERN
#49Apparatus for forming magnetic recording heads
#50Method of lapping a magnetic head slider
#51PERPENDICULAR WRITE HEAD HAVING A STEPPED FLARE STRUCTURE AND METHOD OF MANUFACTURE THEREOF
#52Method for manufacturing a magnetic write head
#53Perpendicular write head having a stepped flare structure and method of manufacture thereof
#54Method for manufacturing thin film magnetic heads
#55Thin film magnetic head having similarly structured resistive film pattern and magnetic bias layer
#56Testing method of magnetic head by using inductance
#57MONITORING ELEMENT FOR A MAGNETIC RECORDING HEAD AND METHOD OF MANUFACTURING A MAGNETIC RECORDING HEAD
#58Long-term asymmetry tracking in magnetic recording devices
#59Method for manufacturing a perpendicular magnetic write pole using an electrical lapping guide for tight write pole flare point control
#60METHOD OF EVALUATING MAGNETORESISTIVE HEAD
#61Method, system, and computer program product for estimating adjacent track erasure risk by determining erase band width growth rates
#62CORROSION DETECTION METHOD AND MONITORING PATTERN USED THEREIN
#63Test device and method for measurement of tunneling magnetoresistance properties of a manufacturable wafer by the current-in-plane-tunneling technique
#64Test components fabricated with pseudo sensors used for determining the resistance of an MR sensor
#65Test components fabricated with large area sensors used for determining the resistance of an MR sensor
#66Wafer level testing
#67Method of manufacturing a thermally assisted magnetic head
#68Magnetoresistive effect element and manufacturing method thereof
#69Magnetic head and magnetic disk apparatus
#70Method of manufacturing a perpendicular magnetic write head with stepped trailing magnetic shield with electrical lapping guide control
#71Read sensor testing using thermal magnetic fluctuation noise spectra
#72Method for manufacturing a magnetic write head
#73Magnetic head substructure for use for manufacturing a magnetic head
#74Method for manufacturing a perpendicular magnetic write head
#75Magnetic head slider manufacturing method
#76MAGNETIC MEDIA HAVING A SERVO TRACK WRITTEN WITH A PATTERNED MAGNETIC RECORDING HEAD
#77Magnetic head and method of manufacturing the same
#78Magnetic head slider fabrication method, preamplifier and magnetic disk drive
#79Perpendicular magnetic recording write head with trailing shield having throat height defined by electroplated nonmagnetic pad layer and method for making the head
#80Write element modification control using a galvanic couple
#81Method for manufacturing a magnetic write head
#82Method for redefining the trailing shield throat height in a perpendicular magnetic recording write head
#83Determining smear of a hard disk drive slider
#84Thin-film magnetic head having electric lapping guide and method of making the same
#85Method for manufacturing a magnetic head for perpendicular magnetic data recording
#86Perpendicular write head having a stepped flare structure and method of manufacture thereof
#87Magnetic head slider testing apparatus and magnetic head slider testing method
#88Probe assembly for lapping a bar using a patterned probe
#89Method of manufacturing magnetic head and method of manufacturing magnetic head substructure
#90Method of manufacturing magnetic head
#91Method for preventing TMR MRR drop of a slider and method for manufacturing sliders
#92Magnetic head having a CPP sensor with tunnel barrier layer and ELG material coplanar with the tunnel barrier layer
#93Method of manufacturing magnetic head, and magnetic head substructure
#94Method FPR manufacturing a magnetic write head
#95Optical lapping guide for use in the manufacture of perpendicular magnetic write heads
#96Inspection method of magnetic head slider and inspection device thereof
#97Scanning probe microscopy inspection and modification system
#98Magnetic head structure with diagonal of rectangular-shaped height monitor extending along track width direction
#99Head slider and method of making the same and grinding apparatus for head slider
#100Wafer and insulation characteristic monitoring method
#101Support jig for a chip product
#102Magnetoresistive element, manufacturing method thereof, and magnetic storage device utilizing the same magnetoresistive element
#103Magnetic head structure and method for manufacturing magnetic head structure
#104Increased anisotropy induced by direct ion etch for telecommunications/electronics devices
#105Auxiliary slider-debonding device and slider debonding method
#106METHODS OF MANUFACTURING MAGNETIC HEADS WITH REFERENCE AND MONITORING DEVICES
#107Storage device having slider with sacrificial extension aligned with channel on opposite surface
#108Patterned magnetic recording head having a gap pattern with substantially elliptical or substantially diamond-shaped termination pattern
#109Magnetoresistive sensor having a magnetically stable free layer with a positive magnetostriction
#110Magnetic media having a non timing based servo track written with a patterned magnetic recording head and process for making the same
#111Method for real-time monitoring the fabrication of magnetic memory units
#112Method for merging sensor field-mill and electronic lapping guide material placement for a partial mill process and sensor formed according to the method
#113Method of manufacturing a magnetic head
#114Pad slider design for on-slider ELGs
#115Magnetically anisotropic shield for use in magnetic data recording
#116Magnetic write head having a magnetically anisotropic write pole
#117End point detection for direct ion milling to induce magnetic anisotropy in a magnetic layer
#118Magnetic medium having a soft underlayer with a magnetic anisotropy
#119Magnetic random access memory (MRAM) having increased reference layer anisotropy through ion beam etch of magnetic layers
#120Method for manufacturing a thin film magnetic head
#121Slider having protective films of differing hydrogen content
#122Method of inspecting thin film magnetic head element using scanning electron microscope, and inspecting holding jig
#123Method of manufacturing a spin-valve giant magnetoresistive head
#124Lapping method and station to achieve tight dimension controls for both read and write elements of magnetic recording heads and magnetic storage device formed thereby
#125Method for providing an endpoint layer for ion milling of top of read sensor having top lead connection and sensor formed thereby
#126Thin film magnetic head integrated structure
#127Magnetic head and method of manufacturing same, and magnetic head substructure
#128Scanning probe microscopy inspection and modification system
#129Magnetic head slider testing apparatus and magnetic head slider testing method
#130Magnetic head and method of manufacturing the same
#131Thin film magnetic head wafer with identification information
#132Magnetic recording heads with bearing surface protections and methods of manufacture
#133Method and apparatus for testing tunnel magnetoresistive effect element, manufacturing method of tunnel magnetoresistive effect element and tunnel magnetoresistive effect element
#134Double layer patterning and technique for milling patterns for a servo recording head
#135Manufacturing method and apparatus for magnetic head sliders
#136Magnetic head and magnetic head substructure including resistor element whose resistance corresponds to the length of the track width defining portion of the pole layer
#137Method of lapping row bar in which perpendicular magnetic heads are formed and lapping machine
#138Method of fabricating magnetic sensors with pinned layers with zero net magnetic moment
#139Method and apparatus for forming surface, magnetic head and method of manufacturing the same
#140Magnetic media having a servo track written with a patterned magnetic recording head
#141Individual slider testing
#142Distributed shunt structure for lapping of current perpendicular plane (CPP) heads
#143Method of measuring head characteristics of a data storage device, and data storage device
#144Thin film magnetic head structure, method of manufacturing the same, and method of manufacturing thin film magnetic head
#145Methods of manufacturing magnetic heads with reference and monitoring devices
#146System, method, and apparatus for handling and testing individual sliders in a row-like format in single slider processing systems
#147Method of providing a low-stress sensor configuration for a lithography-defined read sensor
#148Method for making magnetic write head
#149Method for grinding a bar of thin film magnetic elements utilizing a plurality of resistive films
#150Method on manufacturing spin valve film
#151Method for controlling a burnish cycle to minimize cycle time
#152Scanning probe microscopy inspection and modification system
#153ESD shunt for transducing head
#154Thin-film magnetic recording head manufacture using selective imaging
#155Method of marking sintered body and method for manufacturing magnetic head wafer
#156Apparatus for measuring slider mounting position in magnetic head, and magnetic head manufacturing system using the measurement apparatus
#157Method of inspecting thin-film magnetic head and method of making thin-film magnetic head
#158Apparatus and method for closed loop feedback during lapping of magnetic heads
#159Storage device slider with sacrificial lapping extension
#160Method for measuring amount of grinding in magnetic head producing process
#161Storage device slider with sacrificial lapping extension
#162Non-local spin valve sensor for high linear density
#163Determining in-plane bow of a tape drive head module
#164Dual write heater for slider surface topography control in double perpendicular magnetic recording (PMR) writers
#165Reader with shape optimized for higher SNR
#166Measurement of a reversed side shield magnetization condition
#167Electronic lapping guide in a magnetic recording transducer