198293 ⎘
Recording or reproducing using a method not covered by one of the main groups - ; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information; Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
Sub-classes:Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material
#2Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material
#3Memory device, an information storage process, a process, and a structured material
#4Scanning probe microscopy inspection and modification system
#5Data storage device utilizing carbon nanotubes and method for operating
#6Optical disk drive with hybrid solid immersion objective lens
#7Scanning probe microscopy inspection and modification system
#8Memory comprising a memory device and a write unit configured as a probe
#9Optical disk drive with micro-SIL
#10Nanometer scale data storage device and associated positioning system
#11Effecting dynamic measurement of low mass devices
#12Semiconductor storage device
#13High density data storage
#14Nanometer scale data storage device and associated positioning system
#15Scanning probe microscopy inspection and modification system