198297 ⎘
Recording or reproducing using a method not covered by one of the main groups - ; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information Record carriers for recording or reproduction involving the use of microscopic probe means
Sub-classes:PROCESS FOR FABRICATING HIGH DENSITY STORAGE DEVICE WITH HIGH-TEMPERATURE MEDIA
#2Electrical-Effect Data Recording Medium that Includes a Localized Electrical Conduction Layer
#3Method for determining wear of a data storage medium and data storage device
#4Optical storage system using an antenna for recording information data to a phase-change type medium
#5System and method for storing data
#6Fabrication method for phase change diode memory cells
#7Data recording device comprising micro-tips and a recording medium
#8Method and apparatus for storing and reading information in a ferroelectric material
#9Storage device
#10Recording medium comprising ferroelectric layer, nonvolatile memory device comprising recording medium, and methods of writing and reading data for the memory device
#11Data storing and reading apparatus for storing data in a nano-device
#12Method of fabrication of non-volatile memory
#13Dielectric recording medium, and method of and apparatus for producing the same
#14Storage device based on phase-change modulated luminescence
#15Capping layer for enhanced performance media
#16Ultra-high density storage device using phase change diode memory cells and methods of fabrication thereof
#17Ultra-high density storage device using phase change diode memory cells and methods of fabrication thereof