ClassID:

199662

G11C17/02 - CPC Classification

Classification description:

Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using magnetic or inductive elements

Recent Application in this class:
#1
20260011384
2026-01-08

MEMORY DEVICE INCLUDING OTP (ONE TIME PROGRAMMABLE) CELLS AND METHOD OF OPERATING THE SAME

#2
20260011383
2026-01-08

MEMORY DEVICE

#3
20250336450
2025-10-30

MEMORY DEVICE AND METHOD OF OPERATING THE MEMORY DEVICE

#4
20250329365
2025-10-23

MEMORY DEVICE WHICH HAS OPTIMAL REFERENCE RESISTANCE VALUE ACCORDING TO I/O UNIT

#5
20250322894
2025-10-16

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

#6
20240321372
2024-09-26

Memory with one-time programmable (OTP) cells

#7
20220231867
2022-07-21

OPERATING METHOD OF PHYSICALLY UNCLONABLE FUNCTION MAGNETIC MEMORY DEVICE

#8
20200303452
2020-09-24

MJT based anti-fuses with low programming voltage

#9
20190198077
2019-06-27

Semiconductor devices including reversible and one-time programmable magnetic tunnel junctions

#10
20190180173
2019-06-13

METHOD AND APPARATUS FOR USING REFERENCE RESISTOR IN ONE-TIME PROGRAMMABLE MEMORY OF AN ARTIFICIAL INTELLIGENCE INTEGRATED CIRCUIT

#11
20170352395
2017-12-07

Adaptive reference scheme for magnetic memory applications

#12
20170186472
2017-06-29

Adaptive reference scheme for magnetic memory applications

#13
20170178741
2017-06-22

OTP cell with reversed MTJ connection

#14
20170110171
2017-04-20

Semiconductor devices including reversible and one-time programmable magnetic tunnel junctions

#15
20170076818
2017-03-16

Programming of non-volatile memory subjected to high temperature exposure

#16
20170047126
2017-02-16

One-time programmable device with integrated heat sink

#17
20160293268
2016-10-06

Implementation of a one time programmable memory using a MRAM stack design

#18
20160125953
2016-05-05

OTP cell with reversed MTJ connection

#19
20150092479
2015-04-02

Resistance-based memory cells with multiple source lines

#20
20150074433
2015-03-12

Physically unclonable function based on breakdown voltage of metal-insulator-metal device

#21
20140313820
2014-10-23

Field programming method for magnetic memory devices

#22
20140215294
2014-07-31

Error detection and correction of one-time programmable elements

#23
20140071741
2014-03-13

OTP cell with reversed MTJ connection

#24
20140071740
2014-03-13

OTP scheme with multiple magnetic tunnel junction devices in a cell

#25
20140063895
2014-03-06

Low cost programmable multi-state device

#26
20140010006
2014-01-09

Non-reversible state at a bitcell having a first magnetic tunnel junction and a second magnetic tunnel junction

#27
20120033490
2012-02-09

Generating a non-reversible state at a bitcell having a first magnetic tunnel junction and a second magnetic tunnel junction

#28
20100091546
2010-04-15

HIGH DENSITY RECONFIGURABLE SPIN TORQUE NON-VOLATILE MEMORY

#29
20080316801
2008-12-25

Magnetic memory system using MRAM-sensor

#30
20080278996
2008-11-13

Programmable magnetic read only memory (MROM)

#31
20080143382
2008-06-19

Programming matrix

#32
20070205476
2007-09-06

Printed magnetic rom-mprom

#33
20070188190
2007-08-16

Antifuse circuit and method for selectively programming thereof

#34
20070140099
2007-06-21

Read-only magnetic memory device mrom

#35
20060291315
2006-12-28

Antifuse circuit

#36
15946209
2019-06-04

One-time programming (OTP) magneto-resistive random access memory (MRAM) bit cells in a physically unclonable function (PUF) memory in breakdown to a memory state from a previous read operation to provide PUF operations