199779 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals; Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing; Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details; Response verification devices using compression techniques Comparison of products, i.e. test results of chips or with golden chip
SEMICONDUCTOR MEMORY DEVICE
#2TEMPERATURE SENSOR IMPLEMENTED WITH A MAGNETORESISTIVE RANDOM ACCESS MEMORY (MRAM)
#3STORAGE DEVICE INCLUDING NONVOLATILE MEMORY AND MEMORY CONTROLLER AND OPERATING METHOD OF STORAGE DEVICE
#4NONVOLATILE MEMORY DEVICE INCLUDING WORDLINE LEAKAGE CURRENT DETECTOR, STORAGE DEVICE INCLUDING THE SAME, AND METHOD OF OPERATING THE SAME
#5TEST CIRCUIT AND SEMICONDUCTOR MEMORY SYSTEM INCLUDING THE TEST CIRCUIT
#6NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND METHOD OF OPERATING THEREOF
#7Remapping bad blocks in a memory sub-system
#8Storage device for generating identity code and identity code generating method
#9Memory chip test method and apparatus, medium, and device
#10Detect whether die or channel is defective to confirm temperature data
#11Memory device virtual blocks using half good blocks
#12Semiconductor device equipped with global column redundancy
#13Storage device for generating identity code and identity code generating method
#14Remapping bad blocks in a memory sub-system
#15Test method for control chip and related device
#16Memory device virtual blocks using half good blocks
#17Detect whether die or channel is defective to confirm temperature data
#18In-situ detection of anomalies in integrated circuits using machine learning models
#19Method for the secured storing of a data element of a predefined data type to be stored by a computer program in an external memory
#20Memory test method and related device
#21Method, system and computer program product for introducing personalization data in nonvolatile memories of a plurality of integrated circuits
#22Performance evaluation of solid state memory device
#23Multi-channel package, and test apparatus and test method of testing the same
#24Memory devices
#25Semiconductor device including chips capable of comparing data
#26Background memory test apparatus and methods
#27Performance evaluation of solid state memory device
#28SEMICONDUCTOR MEMORY DEVICE
#29Memory test system and method
#30Apparatuses and methods for compressing data received over multiple memory accesses
#31Memory device and test method thereof
#32Memory device and test method thereof
#33Performance evaluation of solid state memory device
#34Memory device and memory system including the same
#35Low Cost Testing and Sorting of Integrated Circuits
#36Memory error detecting apparatus and method
#37Memory corruption detection in engine control systems
#38Low cost testing and sorting for integrated circuits
#39Memory-daughter-card-testing method and apparatus
#40Circuit and method for parallel testing and semiconductor device
#41Memory writing interference test system and method thereof
#42Semiconductor memory device having mount test circuits and mount test method thereof
#43Method of testing data paths in an electronic circuit
#44Self-test output for high-density BIST
#45Detection and correction of defects in semiconductor memories
#46Method and system of analyzing failure in semiconductor integrated circuit device
#47System, method and storage medium for testing a memory module
#48Memory-daughter-card-testing apparatus and method
#49Memory device testable without using data and dataless test method
#50Method and apparatus for latent fault memory scrub in memory intensive computer hardware
#51Parallel bit test circuit and method for semiconductor memory device
#52Apparatus and method for dynamically repairing a semiconductor memory
#53Apparatus and method for testing removable flash memory devices
#54Integrated circuit with test circuit
#55Semiconductor memory component and method for testing semiconductor memory components having a restricted memory area (partial good memories)
#56Selecting and using storage devices based on functional tests and probable time to failure
#57System, method and storage medium for testing a memory module
#58Method for testing an electric circuit
#59Apparatus for dynamically repairing a semiconductor memory
#60Apparatus and method for dynamically repairing a semiconductor memory
#61Defect detection for a memory device