199793 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals; Marginal testing, e.g. race, voltage or current testing Current
System and method for calibrating weak write test mode (WWTM)
#302Leakage current management
#303Semiconductor driver circuit with signal swing balance and enhanced testing
#304Device and procedure for measuring memory cell currents
#305Techniques for storing accurate operating current values
#306Techniques for storing accurate operating current values
#307Failure test method for split gate flash memory
#308MRAM integrated circuits, MRAM circuits, and systems for testing MRAM integrated circuits
#309Semiconductor memory device for simultaneously testing blocks of cells
#310Programmable semi-fusible link read only memory and method of margin testing same
#311Low cost high density rectifier matrix memory
#312System and method for determining the value of a memory element
#313Semiconductor memory device
#314On-chip EE-PROM programming waveform generation
#315Semiconductor memory having a dummy signal line connected to dummy memory cell
#316Memory device
#317Techniques for storing accurate operating current values
#318Memory device tester and method for testing reduced power states
#319Method and apparatus for testing tunnel magnetoresistive effect element
#320Memory device for improved reference current configuration
#321Semiconductor memory device provided with constant-current circuit having current trimming function
#322Devices for detecting current leakage between deep trench capacitors in DRAM devices
#323Circuit, apparatus and method for improved current distribution of output drivers enabling improved calibration efficiency and accuracy
#324Method and circuit for locating anomalous memory cells
#325Current threshold detector
#326Reference current generator, and method of programming, adjusting and/or operating same
#327Circuit and method for reducing leakage current in a row driver circuit in a flash memory during a standby mode of operation
#328SRAM device and a method of operating the same to reduce leakage current during a sleep mode
#329Semiconductor device having logic circuit and macro circuit
#330Semiconductor device
#331Write driver circuit in phase change memory device and method for applying write current
#332Current mirror multi-channel leakage current monitor circuit and method
#333Active compensation for operating point drift in MRAM write operation
#334Soft errors handling in EEPROM devices
#335Semiconductor device
#336Memory bit line leakage repair
#337Soft errors handling in EEPROM devices
#338System and method for determining the value of a memory element
#339Semiconductor memory device having memory block configuration
#340Test structure for improved vertical memory arrays
#341Non-volatile memory with a well bias generation circuit
#342Health monitoring for capacitor array in storage devices
#343Multi-purposed leak detector
#344Embedded transconductance test circuit and method for flash memory cells
#345Adaptive refresh scheduling for memory
#346Memory element status detection
#347Leakage current detection
#348Internal current measurement for age measurements