199857 ⎘
Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store; Aspects relating to interfaces of memory device to external buses Aspects related to pads, pins or terminals
IMPEDANCE ADJUSTMENT CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE IMPEDANCE ADJUSTMENT CIRCUIT
#2SEMICONDUCTOR MEMORY DEVICE AND CONTROL METHOD THEREOF
#3MEMORY DEVICE AND OPERATION METHOD THEREOF
#4Area-efficient, width-adjustable signaling interface
#5On-die termination configuration for integrated circuit
#6MEMORY COMPONENT FOR A SYSTEM-ON-CHIP DEVICE
#7Print component with memory circuit
#8MEMORY DEVICE INCLUDING ON-DIE-TERMINATION CIRCUIT
#9Area-efficient, width-adjustable signaling interface
#10Power management circuit in low-power double data rate memory and management method thereof
#11Print component with memory circuit
#12Multi channel semiconductor device having multi dies and operation method thereof
#13Semiconductor device and memory system
#14Multi-die stacked package memory and output synchronization method thereof
#15Memory component for a system-on-chip device
#16Area-efficient, width-adjustable signaling interface
#17Memory component for a system-on-chip device
#18Memory package structure
#19Print component with memory circuit
#20Memory with per pin input/output termination and driver impedance calibration
#21Print component with memory circuit
#22Print component with memory circuit
#23Print component with memory circuit
#24Memory device including on-die-termination circuit
#25Multi-phase clock division
#26Apparatus with a calibration mechanism
#27Semiconductor device and memory system
#28Memory macro and method of operating the same
#29Memory device including on-die-termination circuit
#30Semiconductor memory device
#31Support for multiple widths of DRAM in double data rate controllers or data buffers
#32Apparatus with a calibration mechanism
#33Semiconductor dies supporting multiple packaging configurations and associated methods
#34Semiconductor device and memory system
#35Multi-channel package, and test apparatus and test method of testing the same
#36Multi-phase clock division
#37Wiring with external terminal
#38Device having multiple channels with calibration circuit shared by multiple channels
#39Memory device
#40Semiconductor apparatus, command training system, and command training method
#41Multi channel semiconductor device having multi dies and operation method thereof
#42Semiconductor memory chip, semiconductor memory package, and electronic system using the same
#43Memory device for receiving operation codes through dq pins, a memory module including the same, and a setting method of the memory module
#44Autonomously controlling a buffer of a processor
#45Multi-phase clock division
#46Semiconductor memory including pads arranged in parallel
#47Memory arrays, and methods of forming memory arrays
#48Memory device including on-die-termination circuit
#49Memory macro which changes operational modes
#50Area-efficient, width-adjustable signaling interface
#51Wiring with external terminal
#52Semiconductor dies supporting multiple packaging configurations and associated methods
#53Pseudo-channeled DRAM
#54Electronic devices
#55Multi channel semiconductor device having multi dies and operation method thereof
#56Device having multiple channels with calibration circuit shared by multiple channels
#57Semiconductor memory device
#58Semiconductor memory device
#59System for improved power distribution to a memory card through remote sense feedback
#60Semiconductor memory device
#61DRAM data path sharing via a split local data bus
#62Switch module, memory storage device and multiplexer
#63Wiring with external terminal
#64Timing based arbiter systems and circuits for ZQ calibration
#65Multi channel semiconductor device having multi dies and operation method thereof
#66Semiconductor memory device, and signal line layout structure thereof
#67Area-efficient, width-adjustable signaling interface
#68Non-volatile memory system with wide I/O memory die
#69Semiconductor device and memory system
#70Semiconductor memory device for calibrating a termination resistance and a method of calibrating the termination resistance thereof
#71Three-dimensional flash NOR memory system with configurable pins
#72Semiconductor device including amplifier
#73Memory macro disableable input-output circuits and methods of operating the same
#74Nonvolatile memory device, memory system including the same and method of operating the same
#75Storage apparatus and data access method
#76Semiconductor memory device including output buffer
#77DRAM data path sharing via a segmented global data bus
#78Semiconductor apparatus capable of improving efficiency for a circuit configuration and a signal line interconnection
#79Layered cross-point semiconductor memory device
#80System on package (SoP) having through silicon via (TSV) interposer with memory controller connected to multiple printed circuit boards (PCB)
#81Source-synchronous data transmission with non-uniform interface topology
#82Buffer memory devices, memory modules and solid state disks with non-uniform memory device connections
#83Adjusting an optimization parameter to customize a signal eye for a target chip on a shared bus
#84Adjusting an optimization parameter to customize a signal eye for a target chip on a shared bus
#85Memory module
#86Semiconductor device having a floating option pad, and a method for manufacturing the same
#87Apparatus and method for page copying within sections of a memory
#88Semiconductor device including a redistribution layer
#89Autonomously controlling a buffer of a processor
#90Semiconductor device
#91Integrated circuit and storage device including the same
#92Method and apparatus to tune a toggle mode interface
#93Memory interface signal reduction
#94Stacked memory chip having reduced input-output load, memory module and memory system including the same
#95Semiconductor memory device including output buffer
#96Multi channel semiconductor device having multi dies and operation method thereof
#97Semiconductor device
#98Semiconductor device and method for operating the same
#99Semiconductor device and method for operating the same
#100Semiconductor device having output buffers and voltage path coupled to output buffers
#101Source-synchronous data transmission with non-uniform interface topology
#102Semiconductor device including amplifier
#103Device having multiple channels with calibration circuit shared by multiple channels
#104Semiconductor device and semiconductor chip
#105Memory controllers to form symbols based on bursts
#106Semiconductor apparatus and data bit inversion
#107Device and apparatus having address and command input paths
#108Single input/output cell with multiple bond pads and/or transmitters
#109Semiconductor memory device and a method of operating the same
#110On-die termination apparatuses and methods
#111Data strobe generation
#112Electronic device and control method for electronic device
#113Integrated circuit with on die termination and reference voltage generation and methods of using the same
#114Memory module
#115I/O driver transmit swing control
#116High performance system topology for NAND memory systems
#117Memory macro configuration and method
#118Multi-chip package system
#119Printed circuit board and memory module including the same
#120Printed-circuit board supporting memory systems with multiple data-bus configurations
#121Semiconductor memory device
#122Training for command/address/control/clock delays under uncertain initial conditions and for mapping swizzled data to command/address signals
#123Semiconductor memory device
#124Address bit remapping scheme to reduce access granularity of DRAM accesses
#125Semiconductor integrated circuit and method for monitoring reference voltage thereof
#126Apparatuses and methods for capturing data in a memory
#127Semiconductor device including option pads for determining an operating structure thereof, and a system having the same
#128Semiconductor memory device
#129High speed multiple memory interface I/O cell
#130Semiconductor device and semiconductor chip
#131NAND FLASH MEMORY SYSTEM AND METHOD PROVIDING REDUCED POWER CONSUMPTION
#132Semiconductor memory including switching circuit for selecting data supply
#133AREA-EFFICIENT, WIDTH-ADJUSTABLE SIGNALING INTERFACE
#134Dynamically setting burst length of double data rate memory device by applying signal to at least one external pin during a read or write transaction
#135Semiconductor integrated circuit
#136Semiconductor memory chip and multi-chip package using the same
#137Memory module cutting off DM pad leakage current
#138Configurable memory banks of a memory device
#139Memory interface signal reduction
#140Memory apparatus supporting multiple width configurations
#141Memory macro configuration and method
#142Dynamically setting burst length of double data rate memory device by applying signal to at least one external pin during a read or write transaction
#143Semiconductor device, memory system, and method for controlling termination of the same
#144Reduced signal interface memory device, system, and method
#145Semiconductor device with a selection circuit selecting a specific pad
#146Memory devices implementing clock mirroring scheme and related memory systems and clock mirroring methods
#147Memory Controller
#148SYNCHRONOUS SEMICONDUCTOR MEMORY DEVICE HAVING ON-DIE TERMINATION CIRCUIT AND ON-DIE TERMINATION METHOD
#149Circuit for providing chip-select signals to a plurality of ranks of a DDR memory module
#150Bank re-assignment in chip to reduce IR drop
#151High speed multiple memory interface I/O cell
#152Semiconductor device including plural electrode pads
#153Semiconductor device and semiconductor package including the same
#154Memory devices implementing clock mirroring scheme and related memory systems and clock mirroring methods
#155Memory chip package with efficient data I/O control
#156Semiconductor memory device having swap function for data output pads
#157Variable-width memory
#158Active termination circuit and method for controlling the impedance of external integrated circuit terminals
#159Memory module cutting off DM pad leakage current
#160SEMICONDUCTOR DEVICE THAT SUPRESSES MALFUNCTIONS DUE TO VOLTAGE REDUCTION
#161Reduced signal interface memory device, system, and method
#162Semiconductor memory including pads coupled to each other
#163Circuit providing load isolation and memory domain translation for memory module
#164Memory module decoder
#165Upgradable system with reconfigurable interconnect
#166Multi-port memory device having self-refresh mode
#167FLASH MEMORY DEVICE WITH SWITCHING INPUT/OUTPUT STRUCTURE
#168Method and apparatus for data inversion in memory device
#169Dynamically setting burst length of double data rate memory device by applying signal to at least one external pin during a read or write transaction
#170INTEGRATED BUFFER DEVICE
#171Pad input signal processing circuit
#172Dynamically setting burst length of double data rate memory device by applying signal to at least one external pin during a read or write transaction
#173Semiconductor memory device and method of performing data reduction test
#174Semiconductor memory device
#175Multi-bank block architecture for integrated circuit memory devices having non-shared sense amplifier bands between banks
#176Logic embedded memory having registers commonly used by macros
#177Memory module with a circuit providing load isolation and memory domain translation
#178Method for accessing in reading, writing and programming to a NAND non-volatile memory electronic device monolithically integrated on semiconductor
#179Semiconductor device with reduced layout area having shared metal line between pads
#180Memory module
#181High speed multiple memory interface I/O cell
#182Semiconductor memory device having input device
#183Synchronous semiconductor memory device having on-die termination circuit and on-die termination method
#184Semiconductor device
#185Configurable memory data path
#186Memory devices implementing clock mirroring scheme and related memory systems and clock mirroring methods
#187Semiconductor integrated circuit device
#188Semiconductor device
#189Semiconductor memory device
#190Memory module decoder
#191Memory device having function of detecting bit line sense amp mismatch
#192Semiconductor memory device for stack package and read data skew control method thereof
#193Memory chip architecture having non-rectangular memory banks and method for arranging memory banks
#194Semiconductor memory device having stacked bank structure
#195Method and system for reading data from a memory
#196Synchronous semiconductor memory device having on-die termination circuit and on-die termination method
#197Semiconductor memory device comprising two rows of pads
#198Method for accessing in reading, writing and programming to a nand non-volatile memory electronic device monolithically integrated on semiconductor
#199Multi-path accessible semiconductor memory device having port state signaling function
#200Semiconductor device
#201Memory module and memory system
#202Multi-port memory device having self-refresh mode
#203Method for generating adjustable MRAM timing signals
#204Semiconductor memory device for adjusting impedance of data output driver
#205Circuitry for a programmable element
#206Semiconductor device and driving method thereof
#207Semiconductor memory device for reducing cell area
#208Semiconductor memory device
#209Flexible capacity memory IC
#210Semiconductor memory device
#211Memory module with a circuit providing load isolation and memory domain translation
#212Memory device and method having a data bypass path to allow rapid testing and calibration
#213Semiconductor memory device
#214Upgradable memory system with reconfigurable interconnect
#215Logic embedded memory having registers commonly used by macros
#216Semiconductor driver circuit with signal swing balance and enhanced testing
#217Semiconductor integrated circuit
#218Memory device capable of changing data output mode
#219Active termination circuit and method for controlling the impedance of external integrated circuit terminals
#220Active termination circuit and method for controlling the impedance of external integrated circuit terminals
#221Method for measuring offset voltage of sense amplifier and semiconductor employing the method
#222Dynamically setting burst length of memory device by applying signal to at least one external pin during a read or write transaction
#223Semiconductor memory device and package thereof, and memory card using the same
#224Memory module decoder
#225Controller device and method for operating same
#226Nonvolatile semiconductor memory with x8/x16 operation mode using address control
#227Circuit of SDRAM and method for data communication
#228High-density memory module utilizing low-density memory components
#229Semiconductor memory device
#230Semiconductor device
#231Synchronous flash memory
#232Memory I/O driving circuit with reduced noise and driving method
#233Semiconductor memory device for reducing cell area
#234Circuitry for a programmable element
#235Input circuit for a memory device
#236Memory chip architecture having non-rectangular memory banks and method for arranging memory banks
#237Semiconductor memory device and multi-chip module comprising the semiconductor memory device
#238Semiconductor device
#239Memory device with different termination units for different signal frequencies
#240Stacked layered type semiconductor memory device
#241Memory device supporting a dynamically configurable core organization
#242Semiconductor device including a register to store a value that is representative of device type information
#243Decoding circuit for on die termination in semiconductor memory device and its method
#244Semiconductor memory device with uniform data access time
#245Semiconductor devices having more than two-rows of pad structures and methods of fabricating the same
#246Semiconductor memory device and method of inputting or outputting data in the semiconductor memory device
#247Memory module and memory-assist module
#248Active termination circuit and method for controlling the impedance of external integrated circuit terminals
#249Active termination circuit and method for controlling the impedance of external integrated circuit terminals
#250Semiconductor device and method of inspecting the same
#251Data output driver
#252Method and apparatus for data inversion in memory device
#253Circuitry for a programmable element
#254Integrated circuit device
#255Memory module including an integrated circuit device
#256Double data rate memory
#257Apparatus with a calibration mechanism