199978 ⎘
Indexing scheme relating to checking stores for correct operation, subsequent repair or testing stores during standby or offline operation; Indexing scheme relating to , for implementation aspects of redundancy repair; Storage technology used for the repair E-fuses, e.g. electric fuses or antifuses, floating gate transistors
Method of operating static random access memory
#2Memory test system and memory test method
#3Memory test system and memory test method
#4Static random access memory and its layout pattern
#5Anti-fuse devices and anti-fuse units
#6Apparatus performing repair operation
#7Modifying memory bank operating parameters
#8Modifying memory bank operating parameters
#9Repair fuse latches using static random access memory array
#10DRAM row sparing
#11Semiconductor device with initialization operation and boot-up operation
#12E-fuse array circuit
#13E-fuse array circuit
#14SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#15Implementing vertical die stacking to distribute logical function over multiple dies in through-silicon-via stacked semiconductor device
#16Semiconductor memory apparatus, memory system, and programming method thereof
#17Semiconductor integrated circuit including column redundancy fuse block
#18Fuse circuit and semiconductor memory device including the same
#19SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING PROGRAMMABLE FUSE
#20Three-terminal antifuse structure having integrated heating elements for a programmable circuit
#21Circuits and methods for processing memory redundancy data
#22Anti-fuse circuit and semiconductor memory device
#23Anti-fuse repair control circuit and semiconductor device including DRAM having the same
#24Fuses for memory repair
#25Fuse circuit and semiconductor memory device including the same
#26Semiconductor integrated circuit including column redundancy fuse block
#27Anti-fuse repair control circuit and semiconductor device including DRAM having the same
#28Redundancy circuit
#29SEMICONDUCTOR DEVICE WITH A PLURALITY OF DIFFERENT ONE TIME PROGRAMMABLE ELEMENTS
#30Antifuse structure having an integrated heating element
#31Semiconductor device
#32Four-terminal antifuse structure having integrated heating elements for a programmable circuit
#33Yield calculation method
#34Semiconductor apparatus, semiconductor storage apparatus, control signal generation method, and replacing method
#35Redundancy circuit and semiconductor apparatus having the redundancy circuit
#36Component testing and recovery
#37Semiconductor storage device including electrical fuse module
#38Semiconductor memory device and semiconductor memory device test method
#39Semiconductor memory device with test circuit
#40Electronic circuit
#41Antifuse structure having an integrated heating element
#42Memory circuit comprising redundant memory areas
#43Memory test circuit and device wafer
#44Utilization of control fuses for functional operations in system-on-chips
#45Modifying memory bank operating parameters