199749 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
Methods and system for verifying memory device integrity
#302METHOD FOR TESTING INTEGRATED CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE
#303Semiconductor device enabling refreshing of redundant memory cell instead of defective memory cell
#304METHOD FOR SETTING OPERATING FREQUENCY OF MEMORY CARD AND RELATED CARD READING APPARATUS
#305Semiconductor testing apparatus and method
#306Semiconductor memory device including a write driver to output a program signal
#307Robust memory link testing using memory controller
#308Integrated solution for identifying malfunctioning components within memory devices
#309Method of testing a memory module and hub of the memory module
#310DRAM testing method
#311Memory device and memory system comprising same
#312Nonvolatile semiconductor memory device capable of testing diodes and manufacturing method thereof
#313Memory controller method and system compensating for memory cell data losses
#314Test partitioning for a non-volatile memory
#315Testing one time programming devices
#316STORAGE DEVICE AND DATA PROCESSING METHOD
#317Memory downsizing in a computer memory subsystem
#318Increased capacity heterogeneous storage elements
#319Method and device for bad-block testing
#320Method of testing PRAM device
#321Apparatus, methods, and system of NAND defect management
#322Content addressable memory match signal test device and methods thereof
#323Multiple access test architecture for memory storage devices
#324TEST SYSTEM AND METHOD
#325Semiconductor storage device
#326MONITORED BURN-IN TEST APPARATUS AND MONITORED BURN-IN TEST METHOD
#327Test circuit for an unprogrammed OTP memory array
#328Memory writing interference test system and method thereof
#329Semiconductor storage device and method for producing semiconductor storage device
#330Memory accessing circuit and method
#331System and method for better testability of OTP memory
#332System and method for testing a data storage device without revealing memory content
#333Semiconductor memory device with high-speed data transmission capability, system having the same, and method for operating the same
#334Semiconductor Testing Apparatus and Method
#335Method and implementation of stress test for MRAM
#336Method for testing memory
#337SEMICONDUCTOR STORAGE DEVICE
#338Method of testing a memory module and hub of the memory module
#339Memory controller method and system compensating for memory cell data losses
#340System and method for electronic testing of multiple memory devices
#341Semiconductor memory device with a reference or dummy cell for testing
#342Error Detection/Correction Method
#343Apparatus, method, and system of NAND defect management
#344Semiconductor integrated circuit device comprising MOS transistor having charge storage layer and method for testing semiconductor memory device
#345Method of testing PRAM device
#346System that prevents reduction in data retention
#347Method of testing a multichip
#348Memory device testable without using data and dataless test method
#349Method and system for determining support for a memory card
#350Sense-amplifier assist (SAA) with power-reduction technique
#351Memory hub tester interface and method for use thereof
#352SENSE-AMPLIFIER ASSIST (SAA) WITH POWER-REDUCTION TECHNIQUE
#353System and method for testing a data storage device without revealing memory content
#354Programming method for write buffer and double word flash programming
#355Systems and methods for detecting a failure event in a field programmable gate array
#356Secure memory card with life cycle phases
#357Method for performing a burn-in test
#358Deterministic addressing of nanoscale devices assembled at sublithographic pitches
#359Semiconductor Integrated Circuit Device and Method of Testing the Same
#360Semiconductor integrated circuit device and method of testing the same
#361Ferroelectric memory to be tested by applying disturbance voltage to a plurality of ferroelectric capacitors at once in direction to weaken polarization, and method of testing the same
#362Memory module and method thereof
#363Adaptive algorithm for MRAM manufacturing
#364Adaptive algorithm for MRAM manufacturing
#365Adaptive algorithm for MRAM manufacturing
#366Memory self-test via a ring bus in a data processing apparatus
#367Provision of debug via a separate ring bus in a data processing apparatus
#368Stacked semiconductor module
#369Memory array manufacturing defect detection system and method
#370Integrity control for data stored in a non-volatile memory
#371Method of verifying a system in which a plurality of master devices share a storage device
#372Memory controller method and system compensating for memory cell data losses
#373Memory controller method and system compensating for memory cell data losses
#374Memory controller method and system compensating for memory cell data losses
#375Adaptive algorithm for MRAM manufacturing
#376Method of testing a memory module and hub of the memory module
#377Memory hub tester interface and method for use thereof
#378System and method for testing a data storage device without revealing memory content
#379Large scale integrated circuit and at speed test method thereof
#380Memory controller method and system compensating for memory cell data losses
#381Method for manufacture of semiconductor device
#382Memory channel self test
#383Memory testing
#384Microcomputer and method of testing same
#385Non-volatile memory evaluating method and non-volatile memory
#386System and method for accelerated information handling system memory testing
#387System and method for testing a memory using DMA
#388Content addressable memory (CAM) capable of finding errors in a CAM cell array and a method thereof
#389Method for performing a burn-in test
#390System for optimizing anti-fuse repair time using fuse id
#391System and method for testing a memory
#392Nanoscale wire-based sublithographic programmable logic arrays
#393Semiconductor integrated circuit device and method of testing the same
#394Power control device and power test system
#395Mixed storage of data fields
#396Fast parallel CRC determination to support SSD testing
#397Predicting tunnel barrier endurance using redundant memory structures
#398Line defect detection circuit and semiconductor memory device including the same
#399Memory power-up testing system
#400Memory internal comparator testing system
#401Smart self-repair device and method of self-repairing a package
#402Replicating test case data into a cache with non-naturally aligned data boundaries
#403Non-volatile storage system with defect detetction and early programming termination
#404Content addressable memory with search line test circuitry
#405Semiconductor memory device, semiconductor system and test method thereof
#406Nonvolatile storage with automated response to program faults
#407Two-terminal memory set features type mechanisms enhancements
#408Double data rate in parallel testing
#409Die-level monitoring in a storage cluster
#410Internal current measurement for age measurements
#411Method and apparatus for flash cache management