199766 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals; Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing; Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details; Address generation devices; Devices for accessing memories, e.g. details of addressing circuits Accessing serial memories
DEVICE DATA PATH MONITOR
#2CHIP DETECTION METHOD AND DEVICE
#3Intelligent memory device test rack
#4Intelligent memory device test rack
#5Gate driving circuit and method for detecting same, array substrate and display apparatus
#6Memory system having memory ranks and related tuning method
#7SRAM macro test flop
#8Memory component for deployment in a dynamic stripe width memory system
#9Memory component for deployment in a dynamic stripe width memory system
#10Controlling a dynamic-stripe-width memory module