199814 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using a fuse hierarchy
SEMICONDUCTOR MEMORY DEVICE
#2EFUSE MEMORY AND OPERATION METHOD THEREOF
#3APPARATUS INCLUDING INTERNAL CAPACITY MEASUREMENT AND ASSOCIATED METHODS
#4POST PACKAGE REPAIR DATA PRESERVATION SYSTEMS AND METHODS
#5FUSE CIRCUIT HAVING RELIABILITY FOR SOFT ERROR
#6MEMORY SYSTEMS AND DEVICES HAVING ENHANCED COLUMN REPAIR CAPABILITY AND METHODS OF OPERATING SAME
#7ELECTRONIC SYSTEM RELATED TO DETECTING A RESULT OF A RUPTURE OPERATION
#8SEMICONDUCTOR DEVICE HAVING FUSE ARRAY
#9STORAGE UNIT ACCESS METHOD, STORAGE UNIT REPAIR METHOD, DIE, AND MEMORY CHIP
#10Indicating a blocked repair operation
#11Circuit for sensing antifuse of DRAMs
#12Integrated circuit, memory and operation method of memory
#13Semiconductor memory device and method of operating semiconductor memory device
#14Apparatuses and methods for bad row mode
#15Memory device capable of repairing defective word lines
#16Memory repair using optimized redundancy utilization
#17Apparatuses and methods for refresh address masking
#18Adjustable programming pulses for a multi-level cell
#19Memory device including redundancy mats
#20Fuse fault repair circuit
#21Semiconductor memory devices, memory systems, and methods of operating semiconductor memory devices
#22Memory repair using optimized redundancy utilization
#23Memory device and operating method thereof
#24Apparatuses and methods for repairing defective memory cells based on a specified error rate for certain memory cells
#25Completing memory repair operations interrupted by power loss
#26EXECUTION METHOD OF FIRMWARE CODE, MEMORY STORAGE DEVICE AND MEMORY CONTROL CIRCUIT UNIT
#27Semiconductor memory devices and methods of operating semiconductor memory devices
#28Latch circuit and semiconductor memory device including the same
#29Area-efficient dynamic memory redundancy scheme with priority decoding
#30Apparatuses and methods for post-package repair protection
#31Test method for memory device
#32APPARATUSES AND METHODS FOR DIE REPLACEMENT IN STACKED MEMORY
#33Adjustable column address scramble using fuses
#34Semiconductor memory devices, memory systems, and methods of operating semiconductor memory devices
#35At-risk memory location identification and management
#36Apparatus and techniques for programming anti-fuses to repair a memory device
#37Field recovery of graphics on-die memory
#38Semiconductor memory devices and methods of operating semiconductor memory devices
#39Apparatuses and methods for repairing defective memory cells based on a specified error rate for certain memory cells
#40Semiconductor device and semiconductor memory apparatus including the semiconductor device
#41Fail redundancy circuits
#42Stacked memory apparatus using error correction code and repairing method thereof
#43Memory repair scheme
#44Fuse latch of semiconductor device
#45Post-packaging environment recovery of graphics on-die memory
#46Electronic device with a fuse array mechanism
#47Semiconductor memory devices, memory systems, and methods of operating semiconductor memory devices
#48Refresh control circuit, semiconductor memory device, and refresh method thereof
#49Techniques to protect fuses against non-destructive attacks
#50Apparatuses and methods for storing redundancy repair information for memories
#51Apparatuses and methods including anti-fuses and for reading and programming of same
#52Memory device for preventing duplicate programming of fail address, and operating method thereof
#53Semiconductor memory devices, methods of operating semiconductor memory devices and memory systems
#54Apparatuses and methods for storing redundancy repair information for memories
#55Semiconductor device
#56Apparatuses and methods including anti-fuses and for reading and programming of same
#57Memory repair scheme
#58Fuse array and memory device
#59Repair circuit used in a memory device for performing error correction code operation and redundancy repair operation
#60Post-packaging environment recovery of graphics on-die memory
#61Repair device and semiconductor device including the repair device
#62Semiconductor device
#63Nonvolatile storage circuit and semiconductor memory device including the same
#64Dynamic random access memory having e-fuses used as capacitors coupled to latches
#65Techniques to protect fuses against non-destructive attacks
#66SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF
#67Semiconductor memory device for performing a post package repair operation and operating method thereof
#68Semiconductor apparatus, memory system and repair method thereof
#69Memory device and controlling method thereof
#70Methods and apparatus for memory programming
#71SYNCHRONIZATION CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
#72Centralized built-in soft-repair architecture for integrated circuits with embedded memories
#73Nonvolatile memory circuit and memory device including same
#74Semiconductor memory devices and methods of operating the same
#75Multi-core data array power gating restoral mechanism
#76Repair of memory devices using volatile and non-volatile memory
#77Semiconductor memory device
#78Anti-fuse of semiconductor device, semiconductor module and system each including the semiconductor device, and method for forming the anti-fuse
#79Method and apparatus for in-system repair of memory in burst refresh
#80Nonvolatile memory integrated circuit with built-in redundancy
#81Memory device includes efuse, and methods for reading and operating the same
#82Memory array, memory device, and methods for reading and operating the same
#83Method for testing array fuse of semiconductor apparatus
#84E-FUSE ARRAY CIRCUIT AND SEMICONDUCTOR MEMORY APPARATUS HAVING THE SAME
#85Integrated circuit and precharge/active flag generation circuit
#86Reliable readout of fuse data in an integrated circuit
#87Multi-core data array power gating restoral mechanism
#88Semiconductor memory device
#89Anti-fuse of semiconductor device, semiconductor module and system each including the semiconductor device, and method for forming the anti-fuse
#90Semiconductor memory device, semiconductor memory module and operation methods thereof
#91Memory device
#92Semiconductor device, memory device, and system including the same
#93Memory having one time programmable (OTP) elements and a method of programming the memory
#94Self-repair device
#95METHOD OF PROGRAMMING FUSE CELLS AND REPAIRING MEMORY DEVICE USING THE PROGRAMMED FUSE CELLS
#96Redundancy evaluation circuit for semiconductor device
#97Semiconductor memory apparatus and method of controlling external voltage using the same
#98E-fuse array circuit
#99Semiconductor memory device
#100Bit based fuse repair
#101Semiconductor device and method of operation
#102Redundancy system for non-volatile memory
#103Semiconductor device having optical fuse and electrical fuse
#104E-fuse array circuit
#105Reference cell repair scheme
#106Repair system for repairing defect using E fuses and method of controlling the same
#107Anti-fuse of semiconductor device, semiconductor module and system each including the semiconductor device, and method for forming the anti-fuse
#108Semiconductor device including ECC circuit
#109Memory device to correct defect cell generated after packaging
#110Column repair circuit
#111Semiconductor integrated circuit having array E-fuse and driving method thereof
#112Memory address repair without enable fuses
#113Memory cell of semiconductor memory device and method for driving the same
#114Memory device
#115Determining fusebay storage element usage
#116Semiconductor device having redundant select line to replace regular select line
#117Semiconductor memory device for improving repair efficiency
#118Semiconductor storage device with wiring that conserves space
#119Repair circuit and control method thereof
#120Fuse circuit and memory device including the same
#121Redundancy circuit for reducing chip area
#122Semiconductor device having optical fuse and electrical fuse
#123Semiconductor memory device and operating method thereof
#124256 Meg dynamic random access memory
#125Fuse set and semiconductor integrated circuit apparatus having the same
#126Fuse circuit and semiconductor device having the same
#127Repair fuse device
#128Semiconductor memory device
#129Redundancy circuit of semiconductor memory
#130Redundancy system for non-volatile memory
#131Shared fuse wrapper architecture for memory repair
#132Semiconductor device
#133Phase-change random access memory
#134Write-once nonvolatile memory with redundancy capability
#135Small-sized fuse box and semiconductor integrated circuit having the same
#136SEMICONDUCTOR MEMORY DEVICE AND DRIVING METHOD OF SEMICONDUCTOR MEMORY DEVICE
#137Memory address repair without enable fuses
#138256 Meg dynamic random access memory
#139Semiconductor memory device
#140Semiconductor device
#141Fuse circuit for use in a semiconductor integrated apparatus
#142Fuse apparatus for controlling built-in self stress and control method thereof
#143Redundancy program circuit and methods thereof
#144Redundancy program circuit and methods thereof
#145Redundancy program circuit and methods thereof
#146SEMICONDUCTOR MEMORY DEVICE HAVING ANTIFUSE CIRCUITRY
#147Semiconductor memory device with redundancy circuit
#148Semiconductor memory device including a repair circuit which includes mode fuses
#149Nonvolatile memory device using resistance material
#150Redundancy circuit semiconductor memory device
#151Method of arranging fuses in a fuse box of a semiconductor memory device and a semiconductor memory device including such an arrangement
#152Semiconductor device
#153Reparable semiconductor memory device
#154Redundancy program circuit and methods thereof
#155Phase-change random access memory
#156Semiconductor memory device with redundancy circuit
#157Memory device having redundancy fuse blocks arranged for testing
#158256 Meg dynamic random access memory
#159Write-once nonvolatile memory with redundancy capability
#160Semiconductor storage device, redundancy circuit thereof, and portable electronic device
#161Redundant circuit for semiconductor memory device
#162Memory address repair without enable fuses
#163Semiconductor memory devices and a method thereof
#164256 Meg dynamic random access memory
#165256 Meg dynamic random access memory
#166Redundancy circuit in semiconductor memory device
#167Semiconductor memory device and semiconductor memory device test method
#168Semiconductor device
#169Address comparator of semiconductor memory device
#170Semiconductor device employing fuse circuit and method for selecting fuse circuit system
#171Semiconductor device employing fuse circuit and method for selecting fuse circuit system
#172Verifying circuit and method of repairing semiconductor device
#173Redundancy circuit and repair method for a semiconductor memory device
#174Apparatus and method for semiconductor device repair with reduced number of programmable elements
#175Redundancy register architecture for soft-error tolerance and methods of making the same
#176Zero-enabled fuse-set
#177Memory address repair without enable fuses
#178Semiconductor device having relief circuit for relieving defective portion
#179Redundancy program circuit and methods thereof
#180Memory circuit comprising redundant memory areas
#181Apparatus and method for semiconductor device repair with reduced number of programmable elements
#182Semiconductor memory device with redundancy circuit
#183Semiconductor memory device with reliable fuse circuit
#184Semiconductor storage device formed to optimize test technique and redundancy technology
#185Semiconductor integrated circuit provided with semiconductor memory circuit having redundancy function and method for transferring address data
#186Semiconductor device
#187Semiconductor memory device
#188Redundancy circuit
#189Semiconductor storage device, redundancy circuit thereof, and portable electronic device
#190Internal data availability for system debugging
#191Memory test circuit and device wafer
#192Mixed storage of data fields
#193Electronic device with a fuse array mechanism
#194Fuse blowing method and fuse blowing system
#195Memory circuit
#196Device for detecting fuse test mode using a fuse and method therefor