199831 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with roll call arrangements for redundant substitutions
Memory device for selectively operating multiple memory groups in different speeds and memory system including the same
#2Memory device for selectively operating multiple memory groups in different speeds and memory system including the same
#3Memory device and memory system capable of using redundancy memory cells
#4Media error reporting improvements for storage drives
#5Redundancy in microelectronic devices, and related methods, devices, and systems
#6Media error reporting improvements for storage drives
#7Memory system for activating redundancy memory cell and operating method thereof
#8Media error reporting improvements for storage drives
#9Semiconductor device and semiconductor system
#10Memory system for activating redundancy memory cell and operating method thereof
#11Method for testing MRAM device and test apparatus thereof
#12Semiconductor device
#13Semiconductor device and semiconductor system
#14Method and apparatus for SOC with optimal RSMA
#15Semiconductor device including a roll call circuit for outputting addresses of defective memory cells
#16Semiconductor device, semiconductor repair system including the same, and method for operating the semiconductor device
#17Semiconductor memory device and operating method thereof
#18Apparatuses and methods for outputting addresses of defective memory cells of a semiconductor device including a roll call circuit
#19Redundancy circuit and semiconductor memory device
#20Semiconductor memory device
#21Semiconductor memory device
#22Redundancy circuit and semiconductor apparatus having the redundancy circuit
#23Semiconductor memory device
#24Semiconductor memory device
#25Semiconductor memory device