199835 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by splitting the decoders in stages
Decoding scheme for error correction code structure
#2Repair circuit and semiconductor apparatus using the same
#3Opportunistic decoding in memory systems
#4Opportunistic decoding in memory systems
#5Flash memory device and method of controlling flash memory device
#6System and method for implementing row redundancy with reduced access time and reduced device area
#7Flash memory device and method of controlling flash memory device
#8Semiconductor memory device and defect remedying method thereof
#9Repairing integrated circuit memory arrays
#10Semiconductor memory device and defect remedying method thereof
#11Memory array decoder
#12Memory array decoder
#13Memory array decoder
#14Semiconductor memory device and defect remedying method thereof
#15System and method for redundancy memory decoding
#16Memory array decoder
#17Semiconductor memory device and defect remedying method thereof
#18Reduced power redundancy address decoder and comparison circuit
#19Encoding circuit for semiconductor device and redundancy control circuit using the same
#20Reduced power redundancy address decoder and comparison circuit