199838 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring in serial access memories, e.g. shift registers, CCDs, bubble memories
LOGIC MODULE FOR USE WITH ENCODED INSTRUCTIONS
#2Sequential error capture during memory test
#3Logic module for use with encoded instructions
#4Column repair in memory
#5Shift register unit, gate line driving device, and driving method
#6Hardware assisted data lookup methods
#7Programmable logic integrated circuit
#8Memory device and operating method thereof for reducing interference between memory cells
#9Data loading circuit and semiconductor memory device comprising same
#10Methods and systems for failure isolation and data recovery in a configuration of series-connected semiconductor devices
#11Methods and systems for failure isolation and data recovery in a configuration of series-connected semiconductor devices
#12Redundancy shift register circuit for driver circuit in active matrix type liquid crystal display device
#13Nonvolatile resistive memories having scalable two-terminal nanotube switches
#14Memory system having a hot-swap function
#15Shift register and electronic device using the same
#16Redundancy shift register circuit for driver circuit in active matrix type liquid crystal display device
#17Column repair in memory