199841 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring with partially good memories combining plural defective memory devices to provide a contiguous address range, e.g. one device supplies working blocks to replace defective blocks in another device
VIRTUAL BLOCK MULTI-PLAN ACCESS SYSTEM
#2OPTIMIZED HANDLING OF NEIGHBOR PLANE DISTURB ISSUES
#3Data Storage Device and Method for Read Disturb Mitigation During Low-Power Modes
#4MIXED-MODE VIRTUAL BLOCK GENERATION
#5AUTOMATICALLY SKIP BAD BLOCK IN CONTINUOUS READ OR SEQUENTIAL CACHE READ OPERATION
#6Grown bad block management in a memory sub-system
#7Grown bad block management in a memory sub-system
#8Dual damascene crossbar array for disabling a defective resistive switching device in the array
#9Uncorrectable ECC
#10MEMORY REPAIR CIRCUIT, MEMORY REPAIR METHOD, AND MEMORY MODULE USING MEMORY REPAIR CIRCUIT
#11Uncorrectable ECC
#12Apparatus and method for checking an operation status of a memory device in a memory system
#13Memory system and operating method thereof
#14Memory system and operating method thereof
#15Memory device and memory system including the same
#16System and method for post-package repair across DRAM banks and bank groups
#17Column repair in memory
#18Memory system for accessing recovered super block and operating method thereof
#19Mapping around defective flash memory of a storage array
#20Performance optimization of read functions in a memory system
#21Performance optimization of read functions in a memory system
#22Masking defective bits in a storage array
#23Semiconductor memory devices and memory systems including the same
#24Semiconductor package including stacked chips and method of fabricating the same
#253D IC structure and method
#26Bad block management mechanism
#27Three dimensional (3D) memory device sparing
#283D IC structure and method
#29Memory system
#30Method of manufacturing flash memory device
#31Manufacturing method for partially-good memory modules with defect table in EEPROM
#32Method and apparatus for storing failing part locations in a module
#33Testing method for permanent electrical removal of an integrated circuit output
#34Enhanced functionality in a two-terminal memory array
#35Testing method for permanent electrical removal of an intergrated circuit output after packaging
#36Method for supporting multi-level striping of non-homogeneous memory to maximize concurrency
#37Column repair in memory