199340 ⎘
Details of stores covered by group; Disposition of storage elements, e.g. in the form of a matrix array Supports for storage elements, e.g. memory modules ; Mounting or fixing of storage elements on such supports
Semiconductor device
#1202High-speed wireless serial communication link for a stacked device configuration using near field coupling
#1203Fully-buffered dual in-line memory module with fault correction
#1204ASIC including vertically stacked embedded non-flash re-writable non-volatile memory
#1205Memory system having improved signal integrity
#1206SEMICONDUCTOR DEVICE MODULE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE MODULE
#1207Fully-buffered dual in-line memory module with fault correction
#1208Reconfigurable connections for stacked semiconductor devices
#1209System and method of increasing addressable memory space on a memory board
#1210Semiconductor device
#1211System and method utilizing distributed byte-wise buffers on a memory module
#1212Nonvolatile semiconductor memory device
#1213Memory apparatus, memory controlling method and program
#1214Defective bit scheme for multi-layer integrated memory device
#1215MULTI-CHIP SYSTEM
#1216Fast data eye retraining for a memory
#1217Memory system and controller with mode for direct access memory
#1218Memory modules and memory devices having memory device stacks, and method of forming same
#1219Load reduced memory module
#1220Load reduced memory module
#1221Load reduced memory module and memory system including the same
#1222Apparatus and method for manufacturing a multiple-chip memory device with multi-stage testing
#1223Semiconductor module and data memory module having the same
#1224Memory downsizing in a computer memory subsystem
#1225Substrates, systems, and devices including structures for suppressing power and ground plane noise, and methods for suppressing power and ground plane noise
#1226Memory device control for self-refresh mode
#1227Semiconductor memory device capable of optimizing signal transmission power and power initializing method thereof
#1228Non-volatile memory with both single and multiple level cells
#1229Media player with non-volatile memory
#1230Delaying a signal communicated from a system to at least one of a plurality of memory circuits
#1231Solid state drive, structure for supporting solid state drives and scalable information processing system including a plurality of solid state drives
#1232Main board and system for memory mounting test
#1233System and method for using a memory mapping function to map memory defects
#1234Memory controlling apparatus and method
#1235Semiconductor device
#1236Method and circuit of calibrating data strobe signal in memory controller
#1237Three-dimensional non-volatile register with an oxygen-ion-based memory element and a vertically-stacked register logic
#1238Memory module and on-line build-in self-test method thereof for enhancing memory system reliability
#1239Semiconductor memory module and semiconductor memory system having termination resistor units
#1240Variable-width memory
#1241Semiconductor storage device and storage system
#1242Semiconductor memory device, memory device support and memory module
#1243Memory module having a plurality of phase change memories, buffer RAM and NAND flash memory
#1244Conveyor-based memory-module tester with elevators distributing moving test motherboards among parallel conveyors for testing
#1245Semiconductor memory device, memory module including the same, and data processing system
#1246Pin diode device and architecture
#1247Magnetic packet memory storage devices, memory systems including such devices, and methods of controlling such devices
#1248State of health monitored flash backed dram module
#1249Staged-backup flash backed dram module
#1250Flash backed DRAM module including logic for isolating the DRAM
#1251Flash backed DRAM module with a selectable number of flash chips
#1252Mobile data storage device with enhanced capacity
#1253Semiconductor integrated circuit device comprising a plurality of semiconductor chips mounted to stack for transmitting a signal between the semiconductor chips
#1254Stacked-die memory systems and methods for training stacked-die memory systems
#1255Semiconductor device
#1256Multiple layers of memory implemented as different memory technology
#1257Memory devices and methods for managing error regions
#1258Memory system, semiconductor memory device, and wiring substrate
#1259Built In Self-Test of Memory Stressor
#1260Semiconductor memory device, memory system including memory controller, and refresh control method for a semiconductor memory device
#1261Test and bring-up of an enhanced cascade interconnect memory system
#1262ENABLING AN INTEGRATED MEMORY CONTROLLER TO TRANSPARENTLY WORK WITH DEFECTIVE MEMORY DEVICES
#1263MEMORY MODULE TESTER
#1264Dynamic random access memory with shadow writes
#1265MEMORY MODULE
#1266Method and system of improving memory power efficiency
#1267Multi-chip package memory device
#1268Memory System having Spare Memory Devices Attached to a Local Interface Bus
#1269Power management of a spare DRAM on a buffered DIMM by issuing a power on/off command to the DRAM device
#1270MULTIPLE SLOT MEMORY SYSTEM
#1271Distributed VDC for SRAM memory
#1272Memory module and layout method therefor
#1273System and method for on-board timing margin testing of memory modules
#1274Memory system topologies including a buffer device and an integrated circuit memory device
#1275Memory system having a plurality of types of memory chips and a memory controller for controlling the memory chips
#1276Memory system having a plurality of types of memory chips and a memory controller for controlling the memory chips
#1277Reconfigurable input/output in hierarchical memory link
#1278Memory modules and methods for modifying memory subsystem performance
#1279Memory module and data input/output system
#1280Data storage system with removable memory module having parallel channels of DRAM memory and flash memory
#1281Memory devices with buffered command address bus
#1282System and method for supporting standard and voltage optimized DIMMs
#1283Sharing resources in multi-dice stacks
#1284METHOD FOR DETERMINING QUALITY PARAMETER AND THE ELECTRONIC APPARATUS USING THE SAME
#1285Circuit providing load isolation and memory domain translation for memory module
#1286MEMORY MODULE HAVING VOLTAGE REGULATOR MODULE
#1287Device for controlling the activity of modules of an array of memory modules
#1288Techniques for implementing accurate device parameters stored in a database
#1289System including hierarchical memory modules having different types of integrated circuit memory devices
#1290Memory module including environmental optimization
#1291Memory module including voltage sense monitoring interface
#1292Adjustable width strobe interface
#1293High density three dimensional semiconductor die package
#1294Processor-memory unit for use in system-in-package and system-in-module devices
#1295MULTI-CHIP MODULE FOR AUTOMATIC FAILURE ANALYSIS
#1296Embedded processor
#1297Memory module having a memory device configurable to different data pin configurations
#1298Memory module decoder
#1299Solid state device products, intermediate solid state devices, and methods of manufacturing and testing the same
#1300Bridge device architecture for connecting discrete memory devices to a system
#1301Multi-die memory device
#1302METHOD FOR DETECTING MEMORY TRAINING RESULT AND COMPUTER SYSTEM USING SUCH METHOD
#1303MEMORY MODULE
#1304Semiconductor module with micro-buffers
#1305Semiconductor device with stacked memory and processor LSIs
#1306SEMICONDUCTOR DEVICE
#1307Multi-resistive integrated circuit memory
#1308System and method for packaged memory
#1309Mass data storage system with non-volatile memory modules
#1310Input-output module, processing platform and method for extending a memory interface for input-output operations
#1311Device and method for controlling solid-state memory system
#1312Upgradable system with reconfigurable interconnect
#1313Data Flow Management Device Transmitting a Plurality of Data Flows
#1314Methods and apparatuses for controlling fully-buffered dual inline memory modules
#1315Integrated circuit memory devices including mode registers set using a data input/output bus
#1316Memory register having an integrated delay-locked loop
#1317Memory system such as a dual-inline memory module (DIMM) and computer system using the memory system
#1318On-die termination of address and command signals
#1319Memory detecting circuit
#1320High speed memory module
#1321Stacked memory module and system
#1322Data processing circuit and method
#1323Controllable voltage reference driver for a memory system
#1324Read leveling of memory units designed to receive access requests in a sequential chained topology
#1325Cascade interconnect memory system with enhanced reliability
#1326Bit shadowing in a memory system
#1327276-PIN BUFFERED MEMORY MODULE WITH ENHANCED MEMORY SYSTEM INTERCONNECT AND FEATURES
#1328AUTOMATIC READ DATA FLOW CONTROL IN A CASCADE INTERCONNECT MEMORY SYSTEM
#1329276-pin buffered memory module with enhanced memory system interconnect and features
#1330Configurable inputs and outputs for memory stacking system and method
#1331System and method for an asynchronous data buffer having buffer write and read pointers
#1332System Having A Controller Device, A Buffer Device And A Plurality Of Memory Devices
#1333Memory module assembly having heat sinks with improved structure
#1334INTEGRATED BUFFER DEVICE
#1335Semiconductor memory module and semiconductor memory system having termination resistor units
#1336Memory module, method for using same and memory system
#1337MEMORY MODULE
#1338METHOD FOR ACCESSING A MEMORY CHIP
#1339Integrated circuit and method of operating an integrated circuit
#1340MEMORY MODULE AND METHOD FOR ACCESSING MEMORY MODULE
#1341METHOD FOR CONTROLLING A MEMORY MODULE AND MEMORY CONTROL UNIT
#1342Semiconductor Device and a Method of Manufacturing the Same
#1343Built in test controller with a downloadable testing program
#1344Proximity optical memory module having an electrical-to-optical and optical-to-electrical converter
#1345Memory module with vertically accessed interposer assemblies
#1346Semiconductor device with non-volatile memory and random access memory
#1347Throttling memory in a computer system
#1348Multi-chip semiconductor device providing enhanced redundancy capabilities
#1349HIGH TEMPERATURE MEMORY DEVICE
#1350System and dynamic random access memory device having a receiver
#1351System and method for providing voltage power gating
#1352Semiconductor device including multi-chip
#1353Memory module and method having improved signal routing topology
#1354Semiconductor device and method of manufacturing the same
#1355Memory control circuit, memory control method, and integrated circuit
#1356Test system for conducting parallel bit test
#1357POWER MANAGEMENT MODULE FOR MEMORY MODULE
#1358ELECTRONIC DEVICE
#1359Apparatus, system, and method for adjusting memory hold time
#1360Memory module and memory device
#1361Semiconductor memory device
#1362Fault diagnosis of serially-addressed memory chips on a test adaptor board to a middle memory-module slot on a PC motherboard
#1363Fault diagnosis of serially-addressed memory modules on a PC motherboard
#1364Systems for two-dimensional main memory including memory modules with read-writeable non-volatile memory devices
#1365Memory modules for two-dimensional main memory
#1366Memory module having signal lines configured for sequential arrival of signals at synchronous memory devices
#1367Memory module with a circuit providing load isolation and memory domain translation
#1368Memory modules and systems including the same
#1369Memory system topologies including a buffer device and an integrated circuit memory device
#1370COMPUTING DEVICE WITH HANDHELD AND EXTENDED COMPUTING UNITS
#1371Memory module
#1372Non-volatile register having a memory element and register logic vertically configured on a substrate
#1373Using cache that is embedded in a memory hub to replace failed memory cells in a memory subsystem
#1374System to provide memory system power reduction without reducing overall memory system performance
#1375System to enable a memory hub device to manage thermal conditions at a memory device level transparent to a memory controller
#1376Operational mode control in serial-connected memory based on identifier
#1377Integrated circuit having a memory cell arrangement and method for reading a memory cell state using a plurality of partial readings
#1378Semiconductor memory devices having vertically-stacked transistors therein
#1379System and methods for memory expansion
#1380System and method for testing a packetized memory device
#1381Laminated mounting structure and memory card
#1382Method for scrubbing storage in a computer memory
#1383Fault injection in dynamic random access memory modules for performing built-in self-tests
#1384Solid state drive with non-volatile memory for a media device
#1385System for providing read clock sharing between memory devices
#1386Data storage and stackable configurations
#1387Media player with non-volatile memory
#1388Memory module with reduced access granularity
#1389Memory module
#1390Placement and routing of ECC memory devices for improved signal timing
#1391Separate testing of continuity between an internal terminal in each chip and an external terminal in a stacked semiconductor device
#1392Semiconductor device
#1393Data transfer between chips in a multi-chip semiconductor device with an increased data transfer speed
#1394Semiconductor Memory Arrangement and System
#1395Planar third dimensional memory with multi-port access
#1396System and method for throttling memory power consumption
#1397Manufacturing method for partially-good memory modules with defect table in EEPROM
#1398Semiconductor memory device capable of identifying a plurality of memory chips stacked in the same package
#1399Maintaining Error Statistics Concurrently Across Multiple Memory Ranks
#1400Self-diagnostic scheme for detecting errors
#1401Memory module with failed memory cell repair function and method thereof
#1402Semiconductor memory device
#1403Method of controlling internal voltage and multi-chip package memory prepared using the same
#1404Portable auxiliary storage device
#1405Redriven/retimed registered dual inline memory module
#1406Operation methods for memory cell and array thereof immune to punchthrough leakage
#1407Operation methods for memory cell and array for reducing punch through leakage
#1408System and method for testing integrated circuit modules comprising a plurality of integrated circuit devices
#1409Semiconductor integrated circuit and electronic device
#1410Test method and semiconductor device
#1411System and method for on-board diagnostics of memory modules
#1412HIGH PERFORMANCE HIGH CAPACITY MEMORY SYSTEMS
#1413Memory modules and memory systems having the same
#1414Three-dimensional memory module architectures
#1415Memory module, system and method of making same
#1416RELIABLE MEMORY MODULE TESTING AND MANUFACTURING METHOD
#1417Memory module having star-type topology and method of fabricating the same
#1418Reconfigurable connections for stacked semiconductor devices
#1419MEMORY DEVICE
#1420Multi-chip memory device with stacked memory chips, method of stacking memory chips, and method of controlling operation of multi-chip package memory
#1421Memory Packages Having Stair Step Interconnection Layers
#1422Supporting un-buffered memory modules on a platform configured for registered memory modules
#1423Motherboard with voltage regulator for supporting DDR2 memory modules and DDR3 memory modules
#1424Non-volatile memory with both single and multiple level cells
#1425Multi-layered memory devices
#1426Address line wiring structure and printed wiring board having same
#1427Multiple address outputs for programming the memory register set differently for different DRAM devices
#1428Dynamic power management of dimms
#1429Apparatus, system, and method for integrated component testing
#1430Method for recording memory parameter and method for optimizing memory
#1431Planar array contact memory cards
#1432Repairing advanced-memory buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module
#1433Planar array contact memory cards
#1434Memory power management
#1435Method and apparatus for cascade memory
#1436Three dimensional structure memory
#1437Method for self-test and self-repair in a multi-chip package environment
#1438Buffered memory module supporting double the memory device data width in the same physical space as a conventional memory module
#1439Integrated circuit memory devices that support selective mode register set commands
#1440Optimizing the size of memory devices used for error correction code storage
#1441Method of flexible memory segment assignment using a single chip select
#1442Method of simple chip select for memory subsystems
#1443Method for creating a memory defect map and optimizing performance using the memory defect map
#1444Programmable diagnostic memory module
#1445System and method for using a memory mapping function to map memory defects
#1446Buffer circuit for a memory module
#1447System and method for implementing a memory defect map
#1448Multiple-type memory
#1449Method of operating a memory apparatus, memory device and memory apparatus
#1450Method of testing a memory module and hub of the memory module
#1451Method and device for enumeration
#1452Electronic Circuit and Method for Selecting an Electronic Circuit
#1453Integrated circuit, chip stack and data processing system
#1454Memory-module controller, memory controller and corresponding memory arrangement, and also method for error correction
#1455Semiconductor memory arrangement
#1456Memory device, control method for the same, control program for the same, memory card, circuit board and electronic equipment
#1457Thermal-emitting memory module, thermal-emitting module socket, and computer system
#1458Rank sparing system and method
#1459Memory module
#1460Memory device, control method for the same, control program for the same, memory card, circuit board and electronic equipment
#1461INTEGRATED CIRCUIT, MEMORY MODULE AND SYSTEM
#1462SEMICONDUCTOR MODULE
#1463Calibration circuit, semiconductor device including the same, and memory module
#1464Memory buffers for merging local data from memory modules
#1465System and method for providing a high fault tolerant memory system
#1466System and method for addressing errors in a multiple-chip memory device
#1467Semiconductor device and semiconductor memory tester
#1468Wirelessly configurable memory device
#1469Semiconductor memory device and method for operating semiconductor memory device
#1470Common modules for DDRII SDRAM and DDRIII SDRAM
#1471Methods for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice
#1472Methods for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice
#1473Systems for programmable chip enable and chip address in semiconductor memory
#1474Electronic circuit package
#1475Apparatus and method for distinguishing temporary and permanent errors in memory modules
#1476Apparatus and method for distinguishing single bit errors in memory modules
#1477Memory Module
#1478Memory redundance circuit techniques
#1479Methods and devices for testing computer memory
#1480Double DRAM bit steering for multiple error corrections
#1481Buffered memory device
#1482Nonvolatile semiconductor memory system
#1483Die module system
#1484Memory module system and method
#1485Memory module routing
#1486Semiconductor memory device capable of optimizing signal transmission power and power initializing method thereof
#1487Apparatus and method for initializing memory
#1488System and device with error detection/correction process and method outputting data
#1489Semiconductor device
#1490Subsystem and method for encoding 64-bit data nibble error correct and cyclic-redundancy code (CRC) address error detect for use in a 76-bit memory module
#1491System and method for electronic testing of multiple memory devices
#1492System and method for providing synchronous dynamic random access memory (SDRAM) mode register shadowing in a memory system
#1493Branching memory-bus module with multiple downlink ports to standard fully-buffered memory modules
#1494Design techniques for stacking identical memory dies
#1495Low power multi-chip semiconductor memory device and chip enable method thereof
#1496Error Detection/Correction Method
#1497Inter-transmission multi memory chip, system including the same and associated method
#1498Semiconductor memory device and defect remedying method thereof
#1499Stacked semiconductor chip package with shared DLL signal and method for fabricating stacked semiconductor chip package with shared DLL signal
#1500Non-volatile memory device manufacturing process testing systems and methods thereof