SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWER POSITIONABLE BY A CONTROLLER IN THE CABINET

FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS

IMAGE CAPTURING DEVICE AND IMAGE GENERATION METHOD

METHOD FOR OBSERVING BIOLOGICAL SAMPLE

DEFORMABLE MIRROR AND X-RAY DEVICE

INSPECTION APPARATUS AND INSPECTION METHOD

FREESTANDING HIGH-ASPECT-RATIO GOLD MASKS FOR LOW-ENERGY, PHASE-BASED X-RAY MICROSCOPY

IMAGING DEVICE AND IMAGE GENERATION METHOD

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWER POSITIONABLE BY A CONTROLLER IN THE CABINET

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Imaging optical arrangement to image an object illuminated by X-rays

Detection system for X-ray inspection of an object

Microscopic system for testing structures and defects on EUV lithography photomasks

Fourier ptychographic imaging systems, devices, and methods

X-ray photoemission system for 3-D laminography

Light field X-ray optics

Table-top ultra supercontinuum and higher harmonic generation source for microscopy

Specimen radiography system comprising cabinet and a specimen drawer positionable by a controller in the cabinet

Method for imaging a region of interest of a sample using a tomographic X-ray microscope, microscope, system and computer program

Optical three-dimensional scanning for collision avoidance in microscopy system

FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS

System and method for high-resolution high contrast x-ray ghost diffraction

Semiconductor X-ray detector

CODED X-RAY TARGET

Radiograph density detection device

X-ray imaging with a detector capable of resolving photon energy

Sensing for automated biological cell injection

X-ray photoemission apparatus for inspection of integrated devices

System and method for nanoscale X-ray imaging of biological specimen

Semiconductor X-ray detector

Semiconductor x-ray detector

Specimen radiography system comprising cabinet and a specimen drawer positionable by a controller in the cabinet

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circuit (IC) dies

3-dimensional x-ray imager

Optical systems, metrology apparatus and associated method

Lamella-shaped targets for x-ray generation

Method for three-dimensionally measuring a 3D aerial image of a lithography mask

Innovative X-ray source for use in tomographic imaging

X-ray microscope

Talbot X-ray microscope

Semiconductor X-ray detector

Statistical analysis in X-ray imaging

High aspect ratio X-ray targets and uses of same

Semiconductor X-ray detector

Arrangement for X-Ray tomography

Embedded pupil function recovery for fourier ptychographic imaging devices

X-ray laser microscopy system and method

Semiconductor X-ray detector

Semiconductor X-ray detector

Radiograph density detection device

Beam shaping slit for small spot size transmission small angle X-ray scatterometry

Method and apparatus for x-ray microscopy

Devices processed using x-rays

X-ray laser microscopy sample analysis system and method

Method for scanning a sample by means of X-ray optics and an apparatus for scanning a sample

Multi energy X-ray microscope data acquisition and image reconstruction system and method

Positive/negative phase shift bimetallic zone plate

X-ray analysis device

Inspection apparatus, inspection method and manufacturing method

Illumination and imaging device for high-resolution X-ray microscopy with high photon energy

High speed X-ray microscope

X-ray laser microscopy system and method

INTEGRATED DEVICES WITH PHOTOEMISSIVE STRUCTURES

Multiplexed Fourier ptychography imaging systems and methods

Illumination optical unit for a mask inspection system and mask inspection system with such an illumination optical unit

Mechanical design of multiple zone plates precision alignment apparatus for hard X-ray focusing in twenty-nanometer scale

Multi energy X-ray microscope data acquisition and image reconstruction system and method

High aspect ratio x-ray targets and uses of same

X-ray apparatus and structure manufacturing method

Devices processed using x-rays

Embedded pupil function recovery for fourier ptychographic imaging devices

Phase Contrast Imaging Using Patterned Illumination/Detector and Phase Mask

Multi energy X-ray microscope data acquisition and image reconstruction system and method

Sample-containing cell for X-ray microscope and method for observing X-ray microscopic image

Stacked zone plates for pitch frequency multiplication

Fourier ptychographic x-ray imaging systems, devices, and methods

Fourier ptychographic imaging systems, devices, and methods

X-ray microscope system with cryogenic handling system and method

Source of X-rays generating a beam of nanometric size and imaging device comprising at least one such source

High speed x-ray inspection microscope

Wave front aberration metrology of optics of EUV mask inspection system

X-ray photoemission microscope for integrated devices

Cluster analysis of unknowns in SEM-EDS dataset

Device for the light stimulation and cryopreservation of biological samples

Scanning probe microscope and surface shape measuring method using same

Optical module for X-ray microscope

Imaging modality using penetrating radiations

X-ray irradiation device and analysis device

Particle beam microscope

Specimen supporting member for X-ray microscope image observation, specimen containing cell for X-ray microscope image observation, and X-ray microscope

Sample Holder with Optical Features for Holding a Sample in an Analytical Device for Research Purposes

Magnifying imaging optical unit and metrology system including same

Differential phase-contrast imaging with circular gratings

SPECIMEN HOLDER ASSEMBLY

ELECTRON SOURCE, ELECTRON GUN, AND ELECTRON MICROSCOPE DEVICE AND ELECTRON BEAM LITHOGRAPHY DEVICE USING IT

COMPUTED TOMOGRAPHY SYSTEM HAVING NANO-SPATIAL RESOLUTION

Optical positioner design in X-ray analyzer for coaxial micro-viewing and analysis

EXTREME ULTRAVIOLET MICROSCOPE

Microstructure inspection method, microstructure inspection apparatus, and microstructure inspection program

Source grating for X-rays, imaging apparatus for X-ray phase contrast image and X-ray computed tomography system

X-ray imaging systems employing point-focusing, curved monochromating optics

Cryotomography x-ray microscopy state

Scintillator-based micro-radiographic imaging device

Fresnel zone plate and x-ray microscope using the fresnel zone plate

Surface contamination analyzer for semiconductor wafers

Extreme ultraviolet microscope

DEVICE AND METHOD FOR GENERATING AN X-RAY POINT SOURCE BY GEOMETRIC CONFINEMENT

METHOD, APPARATUS, AND SYSTEM FOR EXTENDING DEPTH OF FIELD (DOF) IN A SHORT-WAVELENGTH MICROSCOPE USING WAVEFRONT ENCODING

X-ray target and apparatuses using the same

Scintillator-based micro-radiographic imaging device

Method for charging substrate to a potential

Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument

Soft X-ray microscope

X-ray diffraction microscope apparatus and x-ray diffraction measuring method with the x-ray diffraction microscope apparatus

Phase contrast microscope for short wavelength radiation and imaging method

Device and method for generating an x-ray point source by geometric confinement

Microscope system for testing semiconductors

Method for detection of micrometric and sub-micrometric images by means of irradiation of a mask or of a biological specimen with ionizing radiation

X-ray micro-target source

Method for charging substrate to a potential

Condenser zone plate illumination for point X-ray sources

Multiple gas injection system for charged particle beam instruments

Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

X-ray image magnifying device

Methods for achieving high resolution microfluoroscopy

Reflective X-ray microscope and inspection system for examining objects with wavelengths <100 nm

X-ray microscopic inspection apparatus

Focusable and steerable micro-miniature x-ray apparatus

Scanning x-ray microscope with a plurality of simultaneous x-ray probes on the sample

Devices processed using x-rays

High precision detector robot arm system

Measurement system with thickness calculation and method of operation thereof