EMITTER, ELECTRON GUN AND ELECTRONIC APPARATUS, AND EMITTER MANUFACTURING METHOD

Field Emission Electron Source, Electron Optical Device, and Manufacturing Method

Carbon nanomaterial functionalized needle tip modified with low work function material and preparation method thereof

Cathode structure for cold field electron emission and method of fabricating the same

Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus

Field emission devices and methods of manufacturing emitters thereof

FIELD EMISSION DEVICES AND METHODS OF MANUFACTURING GATE ELECTRODES THEREOF

Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus

Electron gun emitting under high voltage, in particular for electron microscopy

Two-wafer MEMS ionization device

Particle sources and methods for manufacturing the same

Electron beam source and method of manufacturing the same

Field emission array having carbon microstructure and method of manufacturing the same

MANUFACTURING METHOD OF ELECTRON SOURCE

Electron beam source and method of manufacturing the same

METHOD OF PREPARING AN ULTRA SHARP TIP, APPARATUS FOR PREPARING AN ULTRA SHARP TIP, AND USE OF AN APPARATUS

Field emission electron source having a carbon nanotube needle

Apparatus and Methods for Growing Nanofibres and Nanotips

Field-emission type electron source and charged particle beam device using the same

Field-emission type electron source and charged particle beam device using the same

Method of producing microrods for electron emitters, and associated microrods and electron emitters