206450 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated specially adapted for studying electrical or magnetical properties of objects
DEVICE FOR HOLDING A SAMPLE, SYSTEM AND MANUFACTURING METHOD
#2SPECIMEN HOLDER
#3Sample fixation mechanism for test with nano-probe, apparatus for test and sample test method
#4Method and system for inspecting an EUV mask
#5Radio-frequency (RF) transmission systems, devices, and methods for in situ transmission electron microscopy
#6Electrical devices with edge slits for mounting sample
#7Method and system for inspecting an EUV mask
#8Cell for electrochemical measurement
#9Dynamic response analysis prober device
#10Method for forming an electrical connection to a sample support in an electron microscope holder
#11Method for forming an electrical connection to a sample support in an electron microscope holder
#12Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask
#13Method and system for inspecting an EUV mask
#14Inspection device
#15Microscopy support structures
#16Fixture for in situ electromigration testing during X-ray microtomography
#17Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing
#18Method and system for inspecting and grounding an EUV mask
#19Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask
#20Microscopy support structures
#21Specimen holder used for mounting samples in electron microscopes
#22Method and system for inspecting an EUV mask
#23Wafer grounding and biasing method, apparatus, and application
#24Circuit probe for charged particle beam system
#25Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopy
#26Charged particle beam apparatus sample holder with magnetic field generating element and sample holding element
#27Method for forming an electrical connection to an sample support in an electron microscope holder
#28Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask
#29Sample holder providing interface to semiconductor device with high density connections
#30Specimen holder used for mounting samples in electron microscopes
#31Specimen holder used for mounting samples in electron microscopes
#32Manipulator carrier for electron microscopes
#33Conductive element for electrically coupling an EUVL mask to a supporting chuck
#34Structure for discharging extreme ultraviolet mask
#35Inspection device
#36Pattern check device and pattern check method
#37Sample holder providing interface to semiconductor device with high density connections
#38Inspection device
#39Specimen holder used for mounting
#40Microscopy support structures
#41Charged particle beam system
#42Wafer grounding and biasing method, apparatus, and application
#43Specimen mount for microscopy
#44Method for inspecting a sample
#45Sample holder for electron microscope
#46Magnetic domain imaging system
#47Charged particle beam application apparatus
#48Charged particle beam device
#49Wafer grounding methodology
#50Method and apparatus for observing inside structures, and specimen holder
#51Defective product inspection apparatus, probe positioning method and probe moving method
#52Charged particle beam application apparatus
#53Semiconductor wafer inspection apparatus
#54Ion beam monitoring arrangement
#55Charged particle beam device probe operation
#56Semiconductor wafer inspection tool and semiconductor wafer inspection method
#57Multi-part specimen holder with conductive patterns
#58Defective product inspection apparatus, probe positioning method and probe moving method
#59Method and apparatus for observing inside structures, and specimen holder
#60Charged particle beam system
#61SEM technique for imaging and measuring electronic transport in nanocomposites based on electric field induced contrast
#62Specimen holder for electron microscope
#63Charged particle beam device probe operation
#64Specimen stage for charged-particle scanning microscopy
#65Probe current imaging
#66Probe tip processing
#67Defective product inspection apparatus, probe positioning method and probe moving method
#68Method and apparatus for observing inside structures, and specimen holder