206451 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated for mounting multiple objects
BATCH-TYPE APPARATUS FOR ATOMIC LAYER ETCHING (ALE), AND ALE METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD BASED ON THE SAME APPARATUS
#2PLASMA PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#3MULTI-CHAMBER PROCESSING TOOL WITH ENHANCED THROUGHPUT
#4APPARATUS AND TECHNIQUES FOR SUBSTRATE PROCESSING USING INDEPENDENT ION SOURCE AND RADICAL SOURCE
#5IN-SITU FOCUS RING COATING
#6CALCULATE WAFERS THICKNESS OUT OF WAFER MAPPING PROCESS
#7VOLUME FILLING CASSETTE FOR LOAD LOCK
#8ION BEAM DEPOSITION APPARATUS AND ION BEAM DEPOSITION METHOD USING THE SAME
#9PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
#10Device and method for substrate transport in vacuum processing systems
#11PLASMA PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#12SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS
#13Manufacturing method of sample collection component
#14ULTRATHIN ATOMIC LAYER DEPOSITION FILM ACCURACY THICKNESS CONTROL
#15SUBSTRATE PROCESSING APPARATUS
#16SYSTEM FOR DEPOSITING PIEZOELECTRIC MATERIALS, METHODS FOR USING THE SAME, AND MATERIALS DEPOSITED WITH THE SAME
#17PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
#18HOLDING DEVICE, AND USE OF THE HOLDING DEVICE
#19SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE TRANSFER METHOD
#20Storage Cassette for Replaceable Parts for Plasma Processing Apparatus
#21Substrate joining method, substrate joining system and method for controlling hydrophilic treatment device
#22APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING SUBSTRATE
#23METHOD FOR CONDITIONING A PLASMA PROCESSING CHAMBER
#24SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
#25BATCH-TYPE APPARATUS FOR ATOMIC LAYER ETCHING (ALE), AND ALE METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD BASED ON THE SAME APPARATUS
#26SEMICONDUCTOR MANUFACTURING APPARATUS AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
#27SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD
#28Fabricating thin film liquid cells
#29Electron microscope imaging adaptor
#30Method and system for imaging a multi-pillar sample
#31BATCH TYPE SUBSTRATE PROCESSING APPARATUS
#32Apparatus and techniques for substrate processing using independent ion source and radical source
#33FILM FORMATION DEVICE
#34Planetary gear assembly for sputtering multiple balloon catheter distal ends
#35Ion implant system having grid assembly
#36Charged Particle Beam System With Receptacle Chamber For Cleaning Sample and Sample Stage
#37Workpiece transport and positioning apparatus
#38Ion implant system having grid assembly
#39Methods, apparatus and systems for production, collection, handling, and imaging of tissue sections
#40Sample base, charged particle beam device and sample observation method
#41High capacity TEM grid
#42Workpiece transport and positioning apparatus
#43Specimen sample holder for workpiece transport apparatus
#44Workpiece holder for workpiece transport apparatus
#45Ion implant system having grid assembly
#46LITHOGRAPHY APPARATUS AND METHOD OF MANUFACTURING ARTICLE
#47Protein layers and their use in electron microscopy
#48Film deposition method
#49Workpiece carrier
#50Sample holder for electron microscope
#51Multi-platen ion implanter and method for implanting multiple substrates simultaneously
#52Sample carrier for an electron microscope
#53Sample block holder
#54Automated sample preparation
#55In-vacuum high speed pre-chill and post-heat stations
#56Method for ex-situ lift-out specimen preparation
#57METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE AND A SAMPLE HOLDER FOR PERFORMING THE METHOD
#58Methods, apparatus and systems for production, collection, handling, and imaging of tissue sections
#59Method and apparatus for ex-situ lift-out specimen preparation
#60Sample block holder
#61Ion implant apparatus and method of ion implantation
#62Particle beam device and method for use in a particle beam device
#63TEM-lamella, process for its manufacture, and apparatus for executing the process
#64Method for ion implant using grid assembly
#65Ion implant system having grid assembly
#66INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGRAPHIC ANALYSIS
#67Method and apparatus for specimen fabrication
#68Particle beam device having a sample holder
#69Ion implanting system
#70Device for holding electron microscope grids and other materials
#71Substrate processing apparatus
#72Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image
#73Method and apparatus for specimen fabrication
#74Ion implantation apparatus
#75Method for preparing transmission electron microscope sample
#76Ion implantation apparatus and a method
#77Ion implantation apparatus
#78Plasma grid implant system for use in solar cell fabrications
#79Methods, apparatus and systems for production, collection, handling, and imaging of tissue sections
#80Ion implanter
#81Sample transfer unit and sample transferring method
#82Method for setting an operating parameter of a particle beam device and a sample holder for performing the method
#83Protein Layers And Their Use In Electron Microscopy
#84Ion implantation apparatus, substrate clamping mechanism, and ion implantation method
#85METHODS AND APPARATUS FOR PROVIDING AND PROCESSING SLICED THIN TISSUE
#86Hydrogen ion implanter using a broad beam source
#87GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT
#88Speciman holder and speciman holder movement device
#89Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method
#90Apparatus and methods for ion beam implantation using ribbon and spot beams
#91Sample holder, method for observation and inspection, and apparatus for observation and inspection
#92Wafer bonding activated by ion implantation
#93Sample enclosure for inspection and methods of use thereof
#94Particle beam device and method for use in a particle beam device
#95Method and apparatus for specimen fabrication
#96METHOD AND APPARATUS FOR SPECIMEN FABRICATION
#97Method and apparatus for specimen fabrication
#98Sample transfer unit and sample transferring method
#99Substrate processing apparatus and method
#100Protein structure
#101Device for preparing microscopy samples
#102System and methods for preparing microscopy samples
#103Apparatus and method for ion beam implantation using ribbon and spot beams
#104Beam processing system and beam processing method
#105Methods for SEM inspection of fluid containing samples
#106E-beam lithography system for synchronously irradiating a plurality of photomasks and method of fabricating photomasks using the same
#107Method and apparatus for specimen fabrication
#108Method and apparatus for specimen fabrication
#109Method and apparatus for specimen fabrication
#110Focused ion beam apparatus for specimen fabrication
#111Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
#112Sample enclosure for a scanning electron microscope and methods of use thereof
#113ION IMPLANTING APPARATUS AND METHOD
#114Method and apparatus for specimen fabrication
#115Method and apparatus for specimen fabrication
#116Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope
#117Methods and apparatuses for the automated production, collection, handling, and imaging of large numbers of serial tissue sections
#118Methods for SEM inspection of fluid containing samples
#119Method and apparatus for specimen fabrication
#120Positioning samples for microscopy, inspection, or analysis