ClassID:

206451

H01J2237/201 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated for mounting multiple objects

Recent Application in this class:
#1
20250279262
2025-09-04

BATCH-TYPE APPARATUS FOR ATOMIC LAYER ETCHING (ALE), AND ALE METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD BASED ON THE SAME APPARATUS

#2
20240412958
2024-12-12

PLASMA PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#3
20240395514
2024-11-28

MULTI-CHAMBER PROCESSING TOOL WITH ENHANCED THROUGHPUT

#4
20240297016
2024-09-05

APPARATUS AND TECHNIQUES FOR SUBSTRATE PROCESSING USING INDEPENDENT ION SOURCE AND RADICAL SOURCE

#5
20240249921
2024-07-25

IN-SITU FOCUS RING COATING

#6
20240178022
2024-05-30

CALCULATE WAFERS THICKNESS OUT OF WAFER MAPPING PROCESS

#7
20240153733
2024-05-09

VOLUME FILLING CASSETTE FOR LOAD LOCK

#8
20240071712
2024-02-29

ION BEAM DEPOSITION APPARATUS AND ION BEAM DEPOSITION METHOD USING THE SAME

#9
20240014013
2024-01-11

PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

#10
20230402266
2023-12-14

Device and method for substrate transport in vacuum processing systems

#11
20230402256
2023-12-14

PLASMA PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

#12
20230395358
2023-12-07

SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS

#13
20230332985
2023-10-19

Manufacturing method of sample collection component

#14
20230298884
2023-09-21

ULTRATHIN ATOMIC LAYER DEPOSITION FILM ACCURACY THICKNESS CONTROL

#15
20230260760
2023-08-17

SUBSTRATE PROCESSING APPARATUS

#16
20230257869
2023-08-17

SYSTEM FOR DEPOSITING PIEZOELECTRIC MATERIALS, METHODS FOR USING THE SAME, AND MATERIALS DEPOSITED WITH THE SAME

#17
20230245870
2023-08-03

PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

#18
20230245868
2023-08-03

HOLDING DEVICE, AND USE OF THE HOLDING DEVICE

#19
20230215754
2023-07-06

SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE TRANSFER METHOD

#20
20230142778
2023-05-11

Storage Cassette for Replaceable Parts for Plasma Processing Apparatus

#21
20230136771
2023-05-04

Substrate joining method, substrate joining system and method for controlling hydrophilic treatment device

#22
20230133714
2023-05-04

APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING SUBSTRATE

#23
20230122167
2023-04-20

METHOD FOR CONDITIONING A PLASMA PROCESSING CHAMBER

#24
20230085592
2023-03-16

SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

#25
20230062485
2023-03-02

BATCH-TYPE APPARATUS FOR ATOMIC LAYER ETCHING (ALE), AND ALE METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD BASED ON THE SAME APPARATUS

#26
20230054452
2023-02-23

SEMICONDUCTOR MANUFACTURING APPARATUS AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE

#27
20230049118
2023-02-16

SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD

#28
20230025535
2023-01-26

Fabricating thin film liquid cells

#29
20220344123
2022-10-27

Electron microscope imaging adaptor

#30
20220319799
2022-10-06

Method and system for imaging a multi-pillar sample

#31
20220130647
2022-04-28

BATCH TYPE SUBSTRATE PROCESSING APPARATUS

#32
20210166946
2021-06-03

Apparatus and techniques for substrate processing using independent ion source and radical source

#33
20200279724
2020-09-03

FILM FORMATION DEVICE

#34
20180229011
2018-08-16

Planetary gear assembly for sputtering multiple balloon catheter distal ends

#35
20170345964
2017-11-30

Ion implant system having grid assembly

#36
20170133197
2017-05-11

Charged Particle Beam System With Receptacle Chamber For Cleaning Sample and Sample Stage

#37
20160372302
2016-12-22

Workpiece transport and positioning apparatus

#38
20160181465
2016-06-23

Ion implant system having grid assembly

#39
20160139007
2016-05-19

Methods, apparatus and systems for production, collection, handling, and imaging of tissue sections

#40
20150318143
2015-11-05

Sample base, charged particle beam device and sample observation method

#41
20150294834
2015-10-15

High capacity TEM grid

#42
20150243473
2015-08-27

Workpiece transport and positioning apparatus

#43
20150170874
2015-06-18

Specimen sample holder for workpiece transport apparatus

#44
20150166273
2015-06-18

Workpiece holder for workpiece transport apparatus

#45
20150072461
2015-03-12

Ion implant system having grid assembly

#46
20150072445
2015-03-12

LITHOGRAPHY APPARATUS AND METHOD OF MANUFACTURING ARTICLE

#47
20150053856
2015-02-26

Protein layers and their use in electron microscopy

#48
20140370205
2014-12-18

Film deposition method

#49
20140361197
2014-12-11

Workpiece carrier

#50
20140353499
2014-12-04

Sample holder for electron microscope

#51
20140272178
2014-09-18

Multi-platen ion implanter and method for implanting multiple substrates simultaneously

#52
20140197311
2014-07-17

Sample carrier for an electron microscope

#53
20140191125
2014-07-10

Sample block holder

#54
20140048972
2014-02-20

Automated sample preparation

#55
20140034846
2014-02-06

In-vacuum high speed pre-chill and post-heat stations

#56
20130340936
2013-12-26

Method for ex-situ lift-out specimen preparation

#57
20130234011
2013-09-12

METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE AND A SAMPLE HOLDER FOR PERFORMING THE METHOD

#58
20130216451
2013-08-22

Methods, apparatus and systems for production, collection, handling, and imaging of tissue sections

#59
20130214468
2013-08-22

Method and apparatus for ex-situ lift-out specimen preparation

#60
20130105677
2013-05-02

Sample block holder

#61
20130056655
2013-03-07

Ion implant apparatus and method of ion implantation

#62
20120305765
2012-12-06

Particle beam device and method for use in a particle beam device

#63
20120189813
2012-07-26

TEM-lamella, process for its manufacture, and apparatus for executing the process

#64
20120129325
2012-05-24

Method for ion implant using grid assembly

#65
20120125259
2012-05-24

Ion implant system having grid assembly

#66
20120117696
2012-05-10

INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGRAPHIC ANALYSIS

#67
20120085924
2012-04-12

Method and apparatus for specimen fabrication

#68
20120074320
2012-03-29

Particle beam device having a sample holder

#69
20120061560
2012-03-15

Ion implanting system

#70
20120006711
2012-01-12

Device for holding electron microscope grids and other materials

#71
20120000629
2012-01-05

Substrate processing apparatus

#72
20110155906
2011-06-30

Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image

#73
20110140006
2011-06-16

Method and apparatus for specimen fabrication

#74
20110073781
2011-03-31

Ion implantation apparatus

#75
20110027486
2011-02-03

Method for preparing transmission electron microscope sample

#76
20100327190
2010-12-30

Ion implantation apparatus and a method

#77
20100327181
2010-12-30

Ion implantation apparatus

#78
20100323508
2010-12-23

Plasma grid implant system for use in solar cell fabrications

#79
20100323445
2010-12-23

Methods, apparatus and systems for production, collection, handling, and imaging of tissue sections

#80
20100314552
2010-12-16

Ion implanter

#81
20100230592
2010-09-16

Sample transfer unit and sample transferring method

#82
20100230584
2010-09-16

Method for setting an operating parameter of a particle beam device and a sample holder for performing the method

#83
20100202672
2010-08-12

Protein Layers And Their Use In Electron Microscopy

#84
20100133449
2010-06-03

Ion implantation apparatus, substrate clamping mechanism, and ion implantation method

#85
20100093022
2010-04-15

METHODS AND APPARATUS FOR PROVIDING AND PROCESSING SLICED THIN TISSUE

#86
20100072401
2010-03-25

Hydrogen ion implanter using a broad beam source

#87
20100025580
2010-02-04

GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT

#88
20100006771
2010-01-14

Speciman holder and speciman holder movement device

#89
20090206258
2009-08-20

Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method

#90
20090189096
2009-07-30

Apparatus and methods for ion beam implantation using ribbon and spot beams

#91
20090166536
2009-07-02

Sample holder, method for observation and inspection, and apparatus for observation and inspection

#92
20090081848
2009-03-26

Wafer bonding activated by ion implantation

#93
20090045349
2009-02-19

Sample enclosure for inspection and methods of use thereof

#94
20090014648
2009-01-15

Particle beam device and method for use in a particle beam device

#95
20090008578
2009-01-08

Method and apparatus for specimen fabrication

#96
20080296516
2008-12-04

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

#97
20080296497
2008-12-04

Method and apparatus for specimen fabrication

#98
20080203302
2008-08-28

Sample transfer unit and sample transferring method

#99
20080142733
2008-06-19

Substrate processing apparatus and method

#100
20080097080
2008-04-24

Protein structure

#101
20080068707
2008-03-20

Device for preparing microscopy samples

#102
20080068706
2008-03-20

System and methods for preparing microscopy samples

#103
20080029716
2008-02-07

Apparatus and method for ion beam implantation using ribbon and spot beams

#104
20080002244
2008-01-03

Beam processing system and beam processing method

#105
20070210253
2007-09-13

Methods for SEM inspection of fluid containing samples

#106
20070181828
2007-08-09

E-beam lithography system for synchronously irradiating a plurality of photomasks and method of fabricating photomasks using the same

#107
20070145302
2007-06-28

Method and apparatus for specimen fabrication

#108
20070145301
2007-06-28

Method and apparatus for specimen fabrication

#109
20070145300
2007-06-28

Method and apparatus for specimen fabrication

#110
20070145299
2007-06-28

Focused ion beam apparatus for specimen fabrication

#111
20070125958
2007-06-07

Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus

#112
20070125947
2007-06-07

Sample enclosure for a scanning electron microscope and methods of use thereof

#113
20070023698
2007-02-01

ION IMPLANTING APPARATUS AND METHOD

#114
20060231776
2006-10-19

Method and apparatus for specimen fabrication

#115
20060192099
2006-08-31

Method and apparatus for specimen fabrication

#116
20060022135
2006-02-02

Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope

#117
20060008790
2006-01-12

Methods and apparatuses for the automated production, collection, handling, and imaging of large numbers of serial tissue sections

#118
20050173632
2005-08-11

Methods for SEM inspection of fluid containing samples

#119
20050054029
2005-03-10

Method and apparatus for specimen fabrication

#120
16355704
2022-07-26

Positioning samples for microscopy, inspection, or analysis