H01J2237/20242 - CPC Classification Index

ClassID:

206458 ⎘

H01J2237/20242 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated; Movement Eucentric movement

Recent Application in this class:

20250132122

2025-04-24

ASSESSMENT APPARATUS AND METHODS

20220238299

2022-07-28

DIFFRACTOMETER FOR CHARGED-PARTICLE CRYSTALLOGRAPHY

20190108971

2019-04-11

Specimen preparation and inspection in a dual-beam charged particle microscope

20140265093

2014-09-18

Workpiece support structure with four degree of freedom air bearing for high vacuum systems

20140117251

2014-05-01

Stage device and control method for stage device

20120298884

2012-11-29

Ion Milling Device, Sample Processing Method, Processing Device, and Sample Drive Mechanism

20110253905

2011-10-20

SPECIMEN HOLDER ASSEMBLY

20100163752

2010-07-01

Method of processing objects by focused ion beam system and carrier used therewith

20090127474

2009-05-21

Electric charged particle beam microscope and microscopy

#10

20080315088

2008-12-25

Composite charged-particle beam system

#11

20070125958

2007-06-07

Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus

#12

20060033045

2006-02-16

Ion beam measurement systems and methods for ion implant dose and uniformity control