Patents-Review.com
ClassID:

206461 ⎘

H01J2237/20264 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated; Movement Piezoelectric devices

Recent Application in this class:
#1
20260092838
2026-04-02

LOCK FOR INTRODUCING AND DISCHARGING A SAMPLE RECEIVING ELEMENT INTO A MASS SPECTROMETER

 #2
20250054797
2025-02-13

SEMICONDUCTOR SUBSTRATE SUPPORT LEVELING APPARATUS

 #3
20250022677
2025-01-16

APPARATUS AND METHOD FOR MANIPULATING A MICROSCOPIC SAMPLE

 #4
20240339286
2024-10-10

SYSTEMS AND METHODS OF CLAMP COMPENSATION

 #5
20230187167
2023-06-15

MEMS PLATFORM FOR THIN FILM NANOMECHANICS CHARACTERIZATION

 #6
20230178330
2023-06-08

Method for Controlling Position of Sample in Charged Particle Beam Device, Program, Storage Medium, Control Device, and Charged Particle Beam Device

 #7
20230120177
2023-04-20

Systems and methods of clamp compensation

 #8
20230101676
2023-03-30

Systems and methods of hysteresis compensation

 #9
20220108907
2022-04-07

Semiconductor substrate support leveling apparatus

 #10
20220108869
2022-04-07

Stage driving system and apparatus or device such as apparatus of charged-particle beam comprising the same

 #11
20210151277
2021-05-20

Systems and methods of hysteresis compensation

 #12
20210151276
2021-05-20

Systems and methods of clamp compensation

 #13
20200312605
2020-10-01

Actuator-assisted positioning systems and methods

 #14
20190353679
2019-11-21

High-precision scanning device

 #15
20190214224
2019-07-11

Vibration control system and optical equipment equipped therewith

 #16
20190006144
2019-01-03

Linear structure for displacement transmission, and one-dimensional and three-dimensional micro movement device using same

 #17
20170133283
2017-05-11

Sensor and adjuster for a consumable

 #18
20160268929
2016-09-15

Micro stage for particle beam column using piezo elements as actuator

 #19
20150206704
2015-07-23

Stage apparatus and sample observation apparatus

 #20
20150069231
2015-03-12

Method for electron tomography

 #21
20140203187
2014-07-24

Charged particle beam lithography system and target positioning device

 #22
20120056100
2012-03-08

Charged particle beam lithography system and target positioning device

 #23
20110260558
2011-10-27

Stage drive device

 #24
20110253905
2011-10-20

SPECIMEN HOLDER ASSEMBLY

 #25
20110155906
2011-06-30

Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image

 #26
20110005306
2011-01-13

Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy

 #27
20100230608
2010-09-16

SAFE MOTION

 #28
20100140473
2010-06-10

NANOROBOT MODULE, AUTOMATION AND EXCHANGE

 #29
20100044578
2010-02-25

Charged particle beam lithography system and target positioning device

 #30
20100006771
2010-01-14

Speciman holder and speciman holder movement device

 #31
20090236540
2009-09-24

STAGE AND ELECTRON MICROSCOPE APPARATUS

 #32
20090146075
2009-06-11

Motorized manipulator for positioning a TEM specimen

 #33
20090095923
2009-04-16

Installation and method of nanofabrication

 #34
20080304142
2008-12-11

Movement Platform for Carrier With 5 Degrees of Freedom

 #35
20080211349
2008-09-04

Stage mechanism, electron microscope having the stage mechanism and method of controlling positioning of stage mechanism

 #36
20070180924
2007-08-09

Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy

 #37
20060131996
2006-06-22

Micro stage using piezoelectric element

 #38
20060010968
2006-01-19

Probe and small sample pick up mechanism