206471 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated Elements or methods for movement independent of sample stage for influencing or moving or contacting or transferring the sample or parts thereof, e.g. prober needles or transfer needles in FIB/SEM systems
PRECISE AUTOMATED CONTROL OF LAMELLA LIFT-OUT
#2TEM GRIDS WITH LIQUID SPREADING LANES
#3LIQUID METAL ION SOURCE DEVICE FOR USING BISMUTH AND ALLOY OF BISMUTH
#4Systems and methods for performing sample lift-out for highly reactive materials
#5IN-LINE DEPTH MEASUREMENTS BY AFM
#6GUIDE PIN, SYSTEM FOR PRECISELY CONTROLLING SPECIMEN INCLUDING THE SAME, AND METHOD FOR OBSERVING SPECIMEN USING THE SAME
#7METHOD FOR PREPARING A CROSS SECTION WITH A FOCUSED ION BEAM
#8METHOD OF SAMPLE PREPARATON AND ANALYSIS
#9Charged Particle Beam Device
#10Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) system
#11METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM
#12Tweezers, Conveyance Device, and Method for Conveying Sample Piece
#13Systems and methods for performing sample lift-out for highly reactive materials
#14METHOD AND MANIPULATION DEVICE FOR HANDLING SAMPLES
#15CONTAINER AND SUBSTRATE TREATING SYSTEM
#16Method for producing lamella, analysis system and method for analyzing sample
#17SUBSTRATE DETACHING APPARATUS
#18ION GENERATOR, FAN COIL UNIT AND AIR CONDITIONING SYSTEM
#19Method for analyzing the 3D structure of biomolecules
#20SUBSTRATE SUPPORT STAGE, PLASMA PROCESSING SYSTEM, AND METHOD OF MOUNTING EDGE RING
#21Focused ion beam apparatus
#22Apparatus and method for large-scale high throughput quantitative characterization and three-dimensional reconstruction of material structure
#23Method of preparing thin film sample piece and charged particle beam apparatus
#24Automated TEM sample preparation
#25Charged particle beam apparatus
#26Specimen preparation and inspection in a dual-beam charged particle microscope
#27Probe with solid beveled tip and method for using same for specimen extraction
#28Charged particle beam apparatus
#29Charged particle instruments
#30Automated TEM sample preparation
#31Charged particle beam apparatus
#32Preparation of specimen arrays on an EM grid
#33Method of manipulating a sample in an evacuated chamber of a charged particle apparatus
#34Stage apparatus with braking system for lens, beam, or vibration compensation
#35Preparation of sample for charged-particle microscopy
#36Method for S/TEM sample analysis
#37Charged particle radiation device and specimen preparation method using said device
#38Charged particle beam apparatus
#39Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing
#40Method for creating S/TEM sample and sample structure
#41Multidimensional structural access
#42Charged particle beam device and sample preparation method
#43Method for S/TEM sample analysis
#44SPECIMEN PREPARATION METHOD
#45Integrated lamellae extraction station
#46Preparation of specimen arrays on an EM grid
#47Detaching probe from TEM sample during sample preparation
#48Circuit probe for charged particle beam system
#49Method of reconstructing electrical probes
#50Charged-particle microscope providing depth-resolved imagery
#51Micro-nano tools with changeable tips for micro-NANO manipulation
#52Method for creating S/TEM sample and sample structure
#53Method for S/TEM sample analysis
#54Methods and apparatuses of using metal needle arrays for specimen lift-out and circuit edit
#55SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOLUMINESCENCE
#56Manipulator carrier for electron microscopes
#57Method for processing samples held by a nanomanipulator
#58Apparatus and method for probe shape processing by ion beam
#59COOLED MANIPULATOR TIP FOR REMOVAL OF FROZEN MATERIAL
#60Microfluidic blotless cryo TEM device and method
#61Method for creating S/TEM sample and sample structure
#62Method and apparatus for rapid preparation of multiple specimens for transmission electron microscopy
#63Method and system for automating sample preparation for microfluidic cryo TEM
#64APPARATUS FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT
#65Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment
#66Method and apparatus for probe contacting
#67Method for stem sample inspection in a charged particle beam instrument
#68Method for stem sample inspection in a charged particle beam instrument
#69Method for S/TEM sample analysis
#70Method for creating S/TEM sample and sample structure
#71Method for creating S/tem sample and sample structure
#72Focused ion beam system and sample processing method using the same
#73Sample inspection apparatus, sample inspection method and sample inspection system
#74Specimen holder, specimen inspection apparatus, and specimen inspection method
#75Method and apparatus for simultaneous SEM and optical examination
#76Inspection method and reagent solution
#77Sample preparing device and sample posture shifting method
#78Method for attaching a sample to a manipulator by melting and then freezing part of said sample
#79Charged particle beam apparatus and specimen holder
#80Method for STEM sample inspection in a charged particle beam instrument
#81Planar view sample preparation
#82Method for failure analysis and system for failure analysis
#83Manipulator
#84Method and apparatus for the automated process of in-situ lift-out
#85Apparatus and method of detecting probe tip contact with a surface
#86Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope
#87Method and apparatus for sample formation and microanalysis in a vacuum chamber
#88Apparatus for sample formation and microanalysis in a vacuum chamber
#89Charged particle beam apparatus and specimen holder
#90Alignment and registration targets for charged particle beam substrate patterning and inspection