ClassID:

204952

H01J27/026 - CPC Classification

Classification description:

Ion beam tubes; Ion sources; Ion guns Cluster ion sources

Recent Application in this class:
#1
20210265125
2021-08-26

Systems and methods for providing a beam of charged particles

#2
20190304738
2019-10-03

Foil sheet assemblies for ion implantation

#3
20160086758
2016-03-24

LIQUID DROPLET INJECTING APPARATUS AND ION SOURCE

#4
20160071734
2016-03-10

Process gas enhancement for beam treatment of a substrate

#5
20160068970
2016-03-10

Method of smoothing solid surface with gas cluster ion beam and solid surface smoothing apparatus

#6
20140319333
2014-10-30

Water cluster ion beam mass spectrometer apparatus and method

#7
20130285552
2013-10-31

Ion generation in mass spectrometers by cluster bombardment

#8
20130180844
2013-07-18

Switchable gas cluster and atomic ion gun, and method of surface processing using the gun

#9
20110300636
2011-12-08

Method for detecting hydrogen peroxide

#10
20110272594
2011-11-10

Gas cluster ion beam system with rapid gas switching apparatus

#11
20110266466
2011-11-03

Method for modifying a material layer using gas cluster ion beam processing

#12
20100319545
2010-12-23

CHARGED PARTICLE SEPARATION APPARATUS AND CHARGED PARTICLE BOMBARDMENT APPARATUS

#13
20100243919
2010-09-30

Method for modifying a material layer using gas cluster ion beam processing

#14
20100207041
2010-08-19

Method of Smoothing Solid Surface with Gas Cluster Ion Beam and Solid Surface Smoothing Apparatus

#15
20090317564
2009-12-24

Method and system for growing a thin film using a gas cluster ion beam

#16
20090166555
2009-07-02

RF electron source for ionizing gas clusters

#17
20090140165
2009-06-04

Method and apparatus for controlling a gas cluster ion beam formed from a gas mixture

#18
20090087969
2009-04-02

Method to improve a copper/dielectric interface in semiconductor devices

#19
20080230714
2008-09-25

Apparatus and methods of forming a gas cluster ion beam using a low-pressure source

#20
20080149826
2008-06-26

Techniques for providing a ribbon-shaped gas cluster ion beam

#21
20080087219
2008-04-17

Dual mode ion source for ion implantation

#22
20080042580
2008-02-21

Dual mode ion source for ion implantation

#23
20070170372
2007-07-26

Dual mode ion source for ion implantation

#24
20070085000
2007-04-19

Mass spectrometer

#25
20060097645
2006-05-11

Dual mode ion source for ion implantation

#26
20060097185
2006-05-11

Ionizer and method for gas-cluster ion-beam formation

#27
20060087244
2006-04-27

Method and apparatus for arc suppression in scanned ion beam processing equipment

#28
20050205802
2005-09-22

Method and apparatus for improved processing with a gas-cluster ion beam

#29
20050205801
2005-09-22

Method and apparatus for improved beam stability in high current gas-cluster ion beam processing system