H01J29/70 - CPC Classification Index

ClassID:

205050 ⎘

H01J29/70 - CPC Classification

Classification description:

Details of cathode-ray tubes or of electron-beam tubes of the types covered by group; Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement Arrangements for deflecting ray or beam

Sub-classes:

H01J29/701 » {Systems for correcting deviation or convergence of a plurality of beams by means of magnetic fields at least} 5
H01J29/708 » {in which the transit time of the electrons has to be taken into account} 0
H01J29/72 » along one straight line or along two perpendicular straight lines 1
H01J29/78 » along a circle, spiral or rotating radial line, e.g. for radar display 0

Recent Application in this class:

20260038760

MAGNETO-ELECTROSTATIC SENSING, FOCUSING, AND STEERING OF ELECTRON BEAMS IN VACUUM ELECTRON DEVICES

20250182994

MULTI-LAYER VACUUM ELECTRON DEVICE AND METHOD OF MANUFACTURE

20240258061

MAGNETO-ELECTROSTATIC SENSING, FOCUSING, AND STEERING OF ELECTRON BEAMS IN VACUUM ELECTRON DEVICES

20240242916

Multi-layer vacuum electron device and method of manufacture

20240047166

Atomic ovens based on electric discharge

20220157550

Magneto-electrostatic sensing, focusing, and steering of electron beams in vacuum electron devices

20220157549

Multi-layer vacuum electron device and method of manufacture

20210257177

Atomic ovens based on electric discharge

20210233731

HYBRID AMPLIFIER FOR INDUCTIVE LOAD

20170296844

Beam position monitors for medical radiation machines

20150340191

Positioning apparatus for an electron beam

20150221467

Method and apparatus for recirculation with control of synchrotron radiation

20150144800

Device for producing an electron beam

20140319346

Inspection system by charged particle beam and method of manufacturing devices using the system

20140117839

Cathode selection method

20140034831

Inspection system by charged particle beam and method of manufacturing devices using the system

20130248733

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF IRRADIATING CHARGED PARTICLE BEAM

20130161529

Switching micro-resonant structures by modulating a beam of charged particles

20130143161

Charged particle beam apparatus

20120032079

Inspection system by charged particle beam and method of manufacturing devices using the system

20090140178

Switching micro-resonant structures by modulating a beam of charged particles

20090032708

Inspection system by charged particle beam and method of manufacturing devices using the system

20070235644

Inspection system by charged particle beam and method of manufacturing devices using the system

20070154846

Switching micro-resonant structures using at least one director

20070103049

Color cathode ray tube apparatus

20060202642

Cathode-ray tube display apparatus

20060097668

Deflection coil for cathode ray tube

20050258732

Horizontal deflection coil

20050162060

Cathode-ray tube apparatus

20050122026

Deflection device for a cathode-ray tube