ClassID:

204507

H01J3/02 - CPC Classification

Classification description:

Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps Electron guns

Sub-classes:
Recent Application in this class:
#1
20200027688
2020-01-23

Substrate processing apparatus

#2
20190259561
2019-08-22

Tunable charged particle vortex beam generator and method

#3
20190069388
2019-02-28

Coupling cancellation in electron acceleration systems

#4
20180336375
2018-11-22

Marking paper products

#5
20180169784
2018-06-21

Additive manufacturing of three-dimensional articles

#6
20160293375
2016-10-06

Electron gun and radiation generating apparatus

#7
20160163500
2016-06-09

Charged particle source

#8
20150270088
2015-09-24

Electron gun, method of controlling same, and electron beam additive manufacturing machine

#9
20150069913
2015-03-12

Ion implantation with charge and direction control

#10
20140346353
2014-11-27

Charged particle vortex wave generation

#11
20140304863
2014-10-09

Marking paper products

#12
20140299789
2014-10-09

Marking paper products

#13
20140299788
2014-10-09

Marking paper products

#14
20140299284
2014-10-09

Marking paper products

#15
20140298929
2014-10-09

Marking paper products

#16
20140000104
2014-01-02

Enclosure and method for handling electron gun or ion gun

#17
20130169157
2013-07-04

Systems and methods for generating coherent matterwave beams

#18
20130140987
2013-06-06

Ion implantation with charge and direction control

#19
20130140977
2013-06-06

Charged particle beam radiation apparatus

#20
20120285647
2012-11-15

Marking paper products

#21
20120248959
2012-10-04

Electron beam source and method of manufacturing the same

#22
20120229024
2012-09-13

Electron source for linear accelerators

#23
20120133281
2012-05-31

Electron beam generating apparatus

#24
20080211376
2008-09-04

Electron gun, electron beam exposure apparatus, and exposure method

#25
20080191144
2008-08-14

Non-axisymmetric charged-particle beam system

#26
20070096620
2007-05-03

Electron gun

#27
20070029497
2007-02-08

Electron beam directed energy device and methods of using same

#28
20060157656
2006-07-20

Multi-radiation source-ferroelectric-based source of plurality of radiation types

#29
20060017002
2006-01-26

Non-axisymmetric charged-particle beam system

#30
20050247876
2005-11-10

Sample dimension measuring method and scanning electron microscope

#31
20050211921
2005-09-29

Electron beam exposure system

#32
20050140269
2005-06-30

Electron emission device including dummy electrodes

#33
20050140268
2005-06-30

Electron emission device

#34
20050001530
2005-01-06

Focusing structure for electron source