H01J3/26 - CPC Classification Index

ClassID:

204529 ⎘

H01J3/26 - CPC Classification

Classification description:

Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps Arrangements for deflecting ray or beam

Sub-classes:

H01J3/28 » along one straight line or along two perpendicular straight lines 0
H01J3/34 » along a circle, spiral, or rotating radial line 5

Recent Application in this class:

20260142115

2026-05-21

RASTERIZED LASER BEAMS FOR SWAPPING INTERCONNECT QUBIT STATES

20210020422

2021-01-21

Charged particle beam apparatus

20160233046

2016-08-11

X-ray generation device having multiple metal target members

20150340191

2015-11-26

Positioning apparatus for an electron beam

20150187534

2015-07-02

Electron emission surface for X-ray generation

20150136967

2015-05-21

Deceleration apparatus for ribbon and spot beams

20150069913

2015-03-12

Ion implantation with charge and direction control

20150029593

2015-01-29

Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrument

20140374617

2014-12-25

High-frequency acceleration type ion acceleration and transportation apparatus having high energy precision

#10

20140326874

2014-11-06

PRINTED CIRCUIT BOARD MULTIPOLE UNITS USED FOR ION TRANSPORTATION

#11

20140239200

2014-08-28

Cathode operating temperature adjusting method, and writing apparatus

#12

20140224997

2014-08-14

Ultra-miniaturized electron optical microcolumn

#13

20140197328

2014-07-17

Ion beam system and method of operating an ion beam system

#14

20140175301

2014-06-26

Ion source, nanofabrication apparatus comprising such source, and a method for emitting ions

#15

20140145090

2014-05-29

Compact gantry for particle therapy

#16

20140098919

2014-04-10

Method and device for changing the direction of movement of a beam of accelerated charged particles

#17

20140070112

2014-03-13

Charged-particle beam exposure apparatus and method of manufacturing article

#18

20140021366

2014-01-23

Charged particle beam apparatus

#19

20140014849

2014-01-16

Permanent Magnet Beam Transport System for Proton Radiation Therapy

#20

20130320226

2013-12-05

Method and apparatus for scanning a surface of an object using a particle beam

#21

20130270449

2013-10-17

DA conversion device and electron beam exposure system using the same

#22

20130256554

2013-10-03

Enhanced integrity projection lens assembly

#23

20130187060

2013-07-25

Compac gantry for particle therapy

#24

20130143161

2013-06-06

Charged particle beam apparatus

#25

20130140987

2013-06-06

Ion implantation with charge and direction control

#26

20130140468

2013-06-06

Charged particle beam scanning using deformed high gradient insulator

#27

20130134323

2013-05-30

Electron beam profile measurement system and method with optional Faraday cup

#28

20130126730

2013-05-23

Sequential radial mirror analyser

#29

20130105703

2013-05-02

Particle beam therapy system and adjustment method for particle beam therapy system

#30

20130092826

2013-04-18

Pattern modification schemes for improved FIB patterning

#31

20130075622

2013-03-28

Particle beam irradiation apparatus and particle beam therapy system

#32

20130001432

2013-01-03

Compact gantry for particle therapy

#33

20120256098

2012-10-11

Ion beam system and method of operating ion beam system

#34

20120126136

2012-05-24

Charged-particle beam exposure apparatus and method of manufacturing article

#35

20120097861

2012-04-26

Deceleration apparatus for ribbon and spot beams

#36

20110215256

2011-09-08

Focused ion beam apparatus

#37

20110192973

2011-08-11

Apparatus for transmission of energy and/or for transportation of an ion as well as a particle beam device having an apparatus such as this

#38

20110121195

2011-05-26

Particle beam therapy system and adjustment method for particle beam therapy system

#39

20110084220

2011-04-14

Enhanced integrity projection lens assembly

#40

20110049382

2011-03-03

Pattern modification schemes for improved FIB patterning

#41

20080203881

2008-08-28

Micro-column with simple structure

#42

20050045832

2005-03-03

Non-dispersive charged particle energy analyzer