205242 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof Tubes for spot-analysing by electron or ion beams; Microanalysers
Sub-classes:Charged Particle Beam Apparatus and Sample Analysis Method
#2EBEAM INSPECTION
#3Ion beam profiling system and related methods
#4Particle beam profiles for analytic equipment configuration
#5Handheld material analyser
#6Sample inspection device and sample inspection method
#7Charged particle microscope with a manipulator device, and method of preparing a specimen with said charged particle microscope
#8X-ray analyzer and method for correcting counting rate
#9Ion source and electron source having single-atom termination structure, tip having single-atom termination structure, gas field ion source, focused ion beam apparatus, electron source, electron microscope, mask repair apparatus, and method of manufacturing tip having single-atom termination structure
#10Electron microscope and control method
#11Electrostatic lens, and parallel beam generation device and parallel beam convergence device which use electrostatic lens and collimator
#12Method of performing electron diffraction pattern analysis upon a sample
#13Sample-specific reference spectra library
#14Image type electron spin polarimeter
#15Projection-type charged particle optical system and imaging mass spectrometry apparatus
#16Inspection of inconsistencies in and on semiconductor devices and structures
#17Method of acquiring EBSP patterns
#18Two rotating electric fields mass analyzer
#19Mineral identification using sequential decomposition into elements from mineral definitions
#20Spectroscopic element and charged particle beam device using the same
#21Multi-beam tool for cutting patterns
#22Object information obtaining apparatus, program, and imaging system
#23Ion sources, systems and methods
#24Ion source, ion gun, and analysis instrument
#25Device for spot size measurement at wafer level using a knife edge and a method for manufacturing such a device
#26Device for mass selective determination of an ion
#27Detecting high atomic number materials with cosmic ray muon tomography
#28Electron beam interference device and electron beam interferometry
#29Device for analising a radiating material using a microprobe
#30Ion sources, systems and methods
#31Charged particle beam apparatus and sample processing method using charged particle beam apparatus
#32Charged-particle radiation apparatus
#33Mineral identification using sequential decomposition into elements from mineral definitions
#34HOLLOW CYLINDRICAL ANALYZER
#35Imaging energy filter for electrically charged particles and spectroscope having same
#36Ion sources, systems and methods
#37Analysis method for semiconductor device
#38APPARATUS AND SYSTEMS FOR INTEGRATED CIRCUIT DIAGNOSIS
#39Device and method for introducing gas for analysis device
#40Wavelength-dispersive X-ray spectrometer
#41Spectrometer for Surface Analysis and Method Therefor
#42Silicon drift X-ray detector
#43Monitoring device of gas introducing device for analyzer
#44SPHERICAL ABERRATION CORRECTION DECELERATING LENS, SPHERICAL ABERRATION CORRECTION LENS SYSTEM, ELECTRON SPECTROMETER, AND PHOTOELECTRON MICROSCOPE
#45Ion sources, systems and methods
#46Charged-Particle Beam System
#47Determining dopant information
#48Electron-beam size measuring apparatus and size measuring method with electron beams
#49Electron induced chemical etching for device level diagnosis
#50Ion sources, systems and methods
#51Ion sources, systems and methods
#52Ion sources, systems and methods
#53Ion sources, systems and methods
#54Aberration-correcting cathode lens microscopy instrument
#55Energy-filtering cathode lens microscopy instrument
#56Ion sources, systems and methods
#57Ion sources, systems and methods
#58Ion sources, systems and methods
#59Ion sources, systems and methods
#60Ion sources, systems and methods
#61Ion sources, systems and methods
#62Ion sources, systems and methods
#63Ion sources, systems and methods
#64Ion sources, systems and methods
#65Ion sources, systems and methods
#66Ion sources, systems and methods
#67Spectrometer for surface analysis and method therefor
#68Insulating film measuring device, insulating film measuring method, insulating film evaluating device, insulating film evaluating method, substrate for electric discharge display element, and plasma display panel
#69Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
#70Lattice strain measuring system and method