Plasma Electron Beam Installation System

METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING

Jig

SUBSTRATE STRESS MANAGEMENT USING DIRECT SELECTIVE AREA PROCESSING

NANOSCALE FAILURE ANALYSIS METHOD

MOBILE ACCELERATOR-BASED VOLUMETRIC FABRICATION METHOD FOR IN-SITU CONSTRUCTION OF THREE-DIMENSIONAL STRUCTURES

Ion Milling Device

Sample Milling System and Apparatus and Method for Image Generation

FOCUS STACKING APPLICATIONS FOR SAMPLE PREPARATION

FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS

CRENELLATED SAMPLE HOLDER AND SPUTTER TARGET FOR SAMPLE PREPARATION IN CRYO ELECTRON MICROSCOPY APPLICATIONS

METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS

3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUME INSPECTION METHOD

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION BEAM AND AN INNOVATIVE SCANNING STRATEGY

Beam bending snout for mobile electron accelerators

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION BEAM AND AN INNOVATIVE SCANNING STRATEGY

SUBSTRATE ANALYSIS SYSTEM

Sample Milling Apparatus, Shield Plate, and Sample Milling Method

Systems and methods for electron beam focusing in electron beam additive manufacturing

METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING

FOCUSED ION BEAM SYSTEM AND METHOD

Methods and structures for semiconductor device testing

Ion milling device

ELECTRON GUN CATHODE TECHNOLOGY

SUBSTRATE PROCESSING SYSTEM AND SUBSTRATE TRANSFER APPARATUS AND METHOD

Focused Ion Beam System and Method of Correcting Deviation of Field of View of Ion Beam

METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS

METHOD OF FABRICATING MEMORY DEVICE

DEVICE FOR REDUCING ICE CONTAMINATION OF A SAMPLE, FOCUSED ION BEAM MILLING APPARATUS AND METHOD FOR FOCUSED ION BEAM MILLING OF A SAMPLE

Apparatus and Method for Milling Sample

Method Of Imaging And Milling A Sample

Method for measuring a sample and microscope implementing the method

Semiconductor Analysis System

Analyzing a sidewall of hole milled in a sample to determine thickness of a buried layer

Ion milling device

Specimen Machining Device and Specimen Machining Method

Method for controlling dynamically controllable ultrawide-amplitude and high-response ion source

SURFACE TREATMENT METHOD AND SURFACE TREATMENT SYSTEM

Verification plates with automated evaluation of melt performance

X-RAY REFERENCE OBJECT, X-RAY DETECTOR, ADDITIVE MANUFACTURING APPARATUS AND METHOD FOR CALIBRATING THE SAME

Writing data generating method, multi charged particle beam writing apparatus, pattern inspecting apparatus, and computer-readable recording medium

Electron gun device

Systems and methods for electron beam focusing in electron beam additive manufacturing

Apparatus and method for forming a three-dimensional article

Infrastructure-scale additive manufacturing using mobile electron accelerators

Frame member for electron beam lithography device and electron beam lithography device

Adaptive geometry for optimal focused ion beam etching

Broad-energy spectrum electron gun

Stage and plasma processing apparatus

System and method of preparing integrated circuits for backside probing using charged particle beams

Ion milling device and ion source adjusting method for ion milling device

ELECTRON BEAM PVD ENDPOINT DETECTION AND CLOSED-LOOP PROCESS CONTROL SYSTEMS

X-ray calibration standard object

Substrate processing system and substrate transfer apparatus and method

Method and system for in situ cross-linking of materials to produce three-dimensional features via electron beams from mobile accelerators

Writing data generating method, multi charged particle beam writing apparatus, pattern inspecting apparatus, and computer-readable recording medium

ELECTRON BEAM ANALYSIS

Electron beam installation and method for working powdered material

Method and system for in situ cross-linking of materials to produce three-dimensional features via electron beams from mobile accelerators

Method for evaluating a region of an object

Coating arrangement and method

Additive layer manufacture using charged particle beams

Electron beam column for three-dimensional printing device, three-dimensional printing device, and three-dimensional printing method

Methods for acquiring planar view stem images of device structures

Device for controlling additive manufacturing machinery

Charged particle beam steering arrangement

Ion milling device, ion source, and ion milling method

Electron beam 3D printing machine

Method for sample orientation for TEM lamella preparation

Planarization, densification, and exfoliation of porous materials by high-energy ion beams

Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control

Ion milling system

Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device

Device for controlling additive manufacturing machinery

Charged particle beam writing method

ELECTRON BEAM PROJECTOR WITH LINEAR THERMAL CATHODE

AXISYMMETIC SINGLE CRYSTAL SHOT TUBE FOR HIGH TEMPERATURE DIE CASTING

Electrostatic lens, and parallel beam generation device and parallel beam convergence device which use electrostatic lens and collimator

Plasma driven particle propagation apparatus and pumping method

Additive manufacturing of three-dimensional articles

Three-dimensional layer-by-layer shaping apparatus, three-dimensional layer-by-layer shaping apparatus control method, and three-dimensional layer-by-layer shaping apparatus control program

Charged particle beam irradiation apparatus and device manufacturing method

Ion milling apparatus and ion milling method

THREE-DIMENSIONAL SHAPING APPARATUS, CONTROL METHOD OF THREE-DIMENSIONAL SHAPING APPARATUS, AND CONTROL PROGRAM OF THREE-DIMENSIONAL SHAPING APPARATUS

Method for measuring resolution of charged particle beam and charged particle beam drawing apparatus

Composite charged particle beam apparatus and control method thereof

Method and device for characterizing an electron beam

Ion milling device and ion milling method

Ion milling device, ion source and ion milling method

WAFER MANUFACTURING SYSTEM AND RELATED PROCESS

X-ray calibration standard object

Method of preparing a plan-view transmission electron microscope sample used in an integrated circuit analysis

Ion milling apparatus and sample processing method

Three-dimensional shaping apparatus, control method thereof, and control program

Method for verifying characteristics of an electron beam

Sample processing evaluation apparatus

Method and device for characterizing an electron beam

WAFER MATERIAL REMOVAL

Source for selectively providing positively or negatively charged particles for a focusing column

APPARATUS AND METHOD FOR SEQUENTIAL MELTING AND REFINING IN A CONTINUOUS PROCESS

Melting method for alloys

Method and system for in-situ cross linking of polymers, bitumen and similar materials to increase strength, toughness and durability via irradiation with electron beams from mobile accelerators

GCIB nozzle assembly

Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control

Multi-step location specific process for substrate edge profile correction for GCIB system

Multi-source plasma focused ion beam system

Ion beam processing method and ion beam processing apparatus

Electron gun, method of controlling same, and electron beam additive manufacturing machine

Scanning electron microscope

Device for producing an electron beam

Multi-step location specific process for substrate edge profile correction for GCIB system

SPECIMEN PREPARATION METHOD

Electron-beam-supported production of electrical components

Electron beam conditioning

Multi-source plasma focused ion beam system

Electron beam melting furnace and method for operating same

Ion beam etching method of magnetic film and ion beam etching apparatus

Apparatus for X-ray generation and method of making same

Electron beam layer manufacturing using scanning electron monitored closed loop control

Ion beam sample preparation apparatus and methods

Method and apparatus for generating electron beams

Melting furnace including wire-discharge ion plasma electron emitter

Methods and apparatus for employing an accelerated neutral beam for improved surface analysis

Inductively coupled plasma source as an electron beam source for spectroscopic analysis

Target for spark vaporization with physical limiting of the propagation of the spark

Roller mold manufacturing device and manufacturing method

Multi charged particle beam writing apparatus and multi charged particle beam writing method

CRUCIBLE, VAPOR DEPOSITION SYSTEM AND METHOD USING THE CRUCIBLE

Charged particle beam device and sample observation method

Plasma immersion ion milling apparatus and method

Ion milling device

Multi-source plasma focused ion beam system

METHOD FOR MACHINING A SUBSTRATE BY MEANS OF AN ION BEAM, AND ION BEAM DEVICE FOR MACHINING A SUBSTRATE

Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control

Protective enclosure for an ion gun, device for depositing materials through vacuum evaporation comprising such a protective enclosure and method for depositing materials

Ion beam source

Electron beam layer manufacturing using scanning electron monitored closed loop control

Selective nanotube growth inside vias using an ion beam

CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VACUUM IN A VACUUM CHAMBER

Closed-loop process control for electron beam freeform fabrication and deposition processes

Method and apparatus for producing large diameter superalloy ingots

ELECTRON BEAM VAPOR DEPOSITION APPARATUS FOR DEPOSITING MULTI-LAYER COATING

Multiple nozzle gas cluster ion beam processing system and method of operating

Apparatus for x-ray generation and method of making same

APPARATUS

Ion plasma electron emitters for a melting furnace

Multi-source plasma focused ion beam system

Apparatus and method for processing a wafer

Electron beam heating system having carbon nanotubes

Method and device for adjusting a beam property in a gas cluster ion beam system

Method and system for treating an interior surface of a workpiece using a charged particle beam

Melting furnace including wire-discharge ion plasma electron emitter

Symmetrical shaper for an ion beam deposition and etching apparatus

Method and apparatus for producing large diameter superalloy ingots

Semiconductor apparatus using ion beam

Directed Multi-Deflected Ion Beam Milling of a Work Piece and Determining and Controlling Extent Thereof

Device and method for milling of material using ions

Electron beam welding method and apparatus

High power, long focus electron source for beam processing

Device and method for milling of material using ions

Apparatus and method for preparing samples

Mounting pad and method for deterring theft and securing air conditioning units against high winds

Mounting pad and method for deterring theft and securing air conditioning units against high winds

Patterned atomic layer etching and deposition using miniature-column charged particle beam arrays

Mounting pad and method for deterring theft and securing air conditioning units against high winds

Precision substrate material multi-processing using miniature-column charged particle beam arrays

Precision substrate material removal using miniature-column charged particle beam arrays

Precision substrate material removal using miniature-column charged particle beam arrays