Patents-Review.com
ClassID:

205555 ⎘

H01J49/0477 - CPC Classification

Classification description:

Particle spectrometers or separator tubes; Details; Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample using a hot fluid

Recent Application in this class:
#1
20250259834
2025-08-14

METHOD FOR SIMULTANEOUS AND RAPID DETERMINATION OF CHLORINE, BROMINE AND IODINE BY PYROHYDROLYSIS COMBINED WITH ICP-MS

 #2
20230420239
2023-12-28

IONIZATION DEVICE AND IONIZATION METHOD

 #3
20230215717
2023-07-06

AN ATMOSPHERIC PRESSURE IONISATION SOURCE

 #4
20230178353
2023-06-08

AN ATMOSPHERIC PRESSURE IONISATION SOURCE

 #5
20210358734
2021-11-18

Ion source

 #6
20210343515
2021-11-04

SYSTEMS AND METHODS FOR MICROARRAY DROPLET IONIZATION ANALYSIS

 #7
20190006165
2019-01-03

System for minimizing electrical discharge during ESI operation

 #8
20180366309
2018-12-20

Low temperature plasma probe with auxiliary heated gas jet

 #9
20110031392
2011-02-10

Atmospheric pressure ion source probe for a mass spectrometer

 #10
20090045330
2009-02-19

Sample ionization at above-vacuum pressures

 #11
20060131497
2006-06-22

Atmospheric pressure ionization with optimized drying gas flow

 #12
20050274905
2005-12-15

Apparatus and method for ion production enhancement

 #13
20050161613
2005-07-28

Apparatus and method for ion production enhancement

 #14
20050151091
2005-07-14

Apparatus and method for ion production enhancement

 #15
20050151090
2005-07-14

Apparatus and method for ion production enhancement

 #16
20050098722
2005-05-12

Target support and method for ion production enhancement

 #17
20050077464
2005-04-14

Apparatus and method for ion production enhancement

 #18
20050072918
2005-04-07

Apparatus and method for ion production enhancement

 #19
16011691
2019-12-03

Systems and methods for hot plasma analysis of analytes using membrane desolvator