205557 ⎘
Particle spectrometers or separator tubes; Details; Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for monitoring the sample temperature
TIME-OF-FLIGHT MASS SPECTROMETER
#2A TEMPERATURE MONITORING SYSTEM
#3TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERATURE-CONTROLLED GAS FLOW-PLASMA SOURCE ANALYSIS METHOD
#4Substance analyzer and substance analysis method
#5Retractable ion guide, grid holder, and technology for removal of cryogenic sample from vacuum
#6Time-of-flight mass spectrometer
#7Time-of-flight mass spectrometry device
#8Bench-top time of flight mass spectrometer
#9MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples
#10Apparatus and system for active heat transfer management in ESI ion sources
#11Mass spectrometry apparatus, gas chromatograph-mass spectrometry apparatus, and flashing current control apparatus
#12Ion trap device
#13System for automatic sampling, sample digestion, and joining a plurality of sample introduction systems
#14Ionization chamber with temperature-controlled gas feed
#15Apparatus and method for ion production enhancement