ClassID:

205568

H01J49/08 - CPC Classification

Classification description:

Particle spectrometers or separator tubes; Details Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons

Recent Application in this class:
#1
20250087474
2025-03-13

Electron Emitter for an Ion Reaction Device of a Mass Spectrometer and Methods of Operating the Same

#2
20240222103
2024-07-04

Internal Fragment Reduction in Top Down ECD Analysis of Proteins

#3
20240014022
2024-01-11

APPARATUS AND METHOD

#4
20230411135
2023-12-21

MAGNET POSITIONING SYSTEM FOR ION SOURCE

#5
20230084351
2023-03-16

Holding device for at least one filament and mass spectrometer

#6
20210375608
2021-12-02

Ionization sources and methods and systems using them

#7
20210116428
2021-04-22

Electron capture detector

#8
20210020422
2021-01-21

Charged particle beam apparatus

#9
20200395204
2020-12-17

Ionization sources and methods and systems using them

#10
20200357595
2020-11-12

3D-printed field emission sources for compact systems

#11
20200328071
2020-10-15

Mass spectrometer, sampling probe, and analysis method

#12
20200266046
2020-08-20

MASS SPECTROMETER

#13
20200118806
2020-04-16

Robust ion source

#14
20190362954
2019-11-28

Mass spectrometry detection device and mass spectrometer

#15
20190341243
2019-11-07

EELS detection technique in an electron microscope

#16
20190287775
2019-09-19

Electron capture dissociation (ECD) utilizing electron beam generated low energy electrons

#17
20190027348
2019-01-24

High-speed low-noise ion current detection circuit and mass spectrometer using the same

#18
20190004071
2019-01-03

LIPID-ANALYZING METHOD USING MASS SPECTROMETRY AND MASS SPECTROMETER

#19
20180358219
2018-12-13

Ion mirror and ion-optical lens for imaging

#20
20180358217
2018-12-13

Robust ion source

#21
20180350574
2018-12-06

Metamaterial photocathode for detection and imaging of infrared radiation

#22
20180315589
2018-11-01

Time-of-flight mass spectrometer

#23
20180277348
2018-09-27

Electron Ionization (EI) Utilizing Different EI Energies

#24
20180114685
2018-04-26

Fourier transform mass spectrometer

#25
20170294298
2017-10-12

Time-of-flight mass spectrometer using a cold electron beam as an ionization source

#26
20170200598
2017-07-13

Mass spectrometer and method for controlling injection of electron beam thereof

#27
20170040152
2017-02-09

Ion detection

#28
20150187557
2015-07-02

Electron source for an RF-free electronmagnetostatic electron-induced dissociation cell and use in a tandem mass spectrometer

#29
20150162178
2015-06-11

Ion trap mass spectrometer using cold electron source

#30
20150162174
2015-06-11

Detectors and methods of using them

#31
20140374583
2014-12-25

ELECTRON IONIZATION (EI) UTILIZING DIFFERENT EI ENERGIES

#32
20140367568
2014-12-18

Anion generating and electron capture dissociation apparatus using cold electrons

#33
20140339423
2014-11-20

Ultraviolet diode and atomic mass analysis ionization source collecting device using ultraviolet diode and an MCP

#34
20140124662
2014-05-08

Device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM

#35
20110291005
2011-12-01

Mass spectrometer

#36
20110278447
2011-11-17

Photoemission induced electron ionization

#37
20100176293
2010-07-15

Mass spectrometer

#38
20100006751
2010-01-14

MINIATURIZED NON-RADIOACTIVE ELECTRON EMITTER

#39
20090294652
2009-12-03

Electron Generation Apparatuses, Mass Spectrometry Instruments, Methods of Generating Electrons, and Mass Spectrometry Methods

#40
20090200459
2009-08-13

Analytic spectrometers with non-radioactive electron sources

#41
20090026362
2009-01-29

Gas analyzer

#42
20080023642
2008-01-31

Electron gun assembly

#43
20070132357
2007-06-14

Electron source for ionization with leakage current suppression

#44
20070114395
2007-05-24

Photoemissive ion mobility spectrometry in ambient air

#45
20050199795
2005-09-15

Apparatus and method for elemental mass spectrometry

#46
20050077897
2005-04-14

Mass spectrometry

#47
15346977
2018-02-20

High dynamic range ion detector for mass spectrometers