Patents-Review.com
ClassID:

205633 ⎘

H01J49/44 - CPC Classification

Classification description:

Particle spectrometers or separator tubes Energy spectrometers, e.g. alpha-, beta-spectrometers

Sub-classes:
Recent Application in this class:
#1
20250391649
2025-12-25

EELS Auto-Alignment Using Full Image Simulation

 #2
20240331993
2024-10-03

CHARGED PARTICLE SPECTROMETER

 #3
20240194466
2024-06-13

EELS Auto-Alignment Using Full Image Simulation

 #4
20210098244
2021-04-01

Input lens and electron spectrometer

 #5
20210010960
2021-01-14

Hard X-ray photoelectron spectroscopy system

 #6
20200176237
2020-06-04

Method and system for determining energy spectrum of X-ray device

 #7
20200075309
2020-03-05

Spectrometry method and device for detecting ionising radiation for the implementation thereof

 #8
20190341243
2019-11-07

EELS detection technique in an electron microscope

 #9
20190180973
2019-06-13

Transmission charged particle microscope with improved EELS/EFTEM module

 #10
20170047215
2017-02-16

ADJUSTABLE AERODYNAMIC LENS SYSTEM FOR AERODYNAMIC FOCUSING OF AEROSOLS

 #11
20170032952
2017-02-02

Multi-reflecting time-of-flight mass spectrometer with axial pulsed converter

 #12
20160372385
2016-12-22

Non-destructive dielectric layer thickness and dopant measuring method

 #13
20160268119
2016-09-15

Electron spectrometer and measurement method

 #14
20150371811
2015-12-24

Monochromator and charged particle apparatus including the same

 #15
20130341504
2013-12-26

Auger elemental identification algorithm

 #16
20130240728
2013-09-19

Method and system for improving characteristic peak signals in analytical electron microscopy

 #17
20130126730
2013-05-23

Sequential radial mirror analyser

 #18
20050030373
2005-02-10

Multi-mode charged particle beam device

 #19
15639477
2018-06-12

Electron spectrometer

 #20
13724890
2014-04-22

Mass spectrometer