221570 ⎘
Manipulating of pulses not covered by one of the other main groups of this subclass; Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using bipolar transistors using clock signals
SEMICONDUCTOR MEMORY DEVICE FOR DETERMING OPERATION STATE WITH DETECTING FREQUENCY OF INPUT CLOCK SIGNAL
#2Input clock buffer and clock signal buffereing method
#3Input driven self-clocked dynamic comparator
#4Device detecting abnormality of secondary battery and semiconductor device
#5Spectrally efficient digital logic (SEDL) digital to analog converter (DAC)
#6Spectrally efficient digital logic (SEDL) analog to digital converter (ADC)
#7Sampling device
#8Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures
#9Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures
#10Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures
#11Systems, Circuits and Methods for Extended Range Input Comparison
#12Quantum tunneling devices and circuits with lattice-mismatched semiconductor structures
#13Latched comparator circuitry with reduced clock feedthrough
#14Clock duty cycle measurement
#15CMOS frequency reference circuit with temperature coefficient cancellation