ClassID:

222327

H03M1/109 - CPC Classification

Classification description:

Analogue/digital conversion; Digital/analogue conversion; Calibration or testing; Measuring or testing for dc performance, i.e. static testing

Recent Application in this class:
#1
20240187014
2024-06-06

TESTING ADCs

#2
20230031516
2023-02-02

Method of testing electronic circuits and corresponding circuit

#3
20210328594
2021-10-21

Systems with ADC circuitry and associated methods

#4
20210165043
2021-06-03

Method of testing electronic circuits and corresponding circuit

#5
20200228130
2020-07-16

Switching circuit for checking an analog input circuit of an A/D converter

#6
20190131993
2019-05-02

ADC self-test using time base and current source

#7
20180198460
2018-07-12

Built-in self-test for ADC

#8
20180191362
2018-07-05

Pattern based estimation of errors in ADC

#9
20170134036
2017-05-11

Method and circuit for testing successive approximation ADC

#10
20170019120
2017-01-19

Systems and methods for identifying a failure in an analog to digital converter

#11
20160336951
2016-11-17

Analog-to-digital converting device and method of operating analog-to-digital converting device

#12
20160305999
2016-10-20

Circuit for measuring flicker noise and method of using the same

#13
20160211861
2016-07-21

System and method for measuring the DC-transfer characteristic of an analog-to-digital converter

#14
20150326238
2015-11-12

SEMICONDUCTOR DEVICE

#15
20150256193
2015-09-10

Semiconductor integrated circuit device

#16
20150256190
2015-09-10

Analog-to-digital conversion circuit

#17
20150188557
2015-07-02

Semiconductor device

#18
20140333460
2014-11-13

Memoryless sliding window histogram based BIST

#19
20140266823
2014-09-18

Systems and methods for estimation of offset and gain errors in a time-interleaved analog-to-digital converter

#20
20140253352
2014-09-11

Semiconductor integrated circuit device

#21
20140203954
2014-07-24

ADC testing

#22
20140049415
2014-02-20

Testing of digital to analog converters in serial interfaces

#23
20130249723
2013-09-26

Method and apparatus for self-test of successive approximation register (SAR) A/D converter

#24
20130249721
2013-09-26

System and method for detection of ADC errors

#25
20120256774
2012-10-11

Method and apparatus for self-test of successive approximation register (SAR) A/D converter

#26
20120229314
2012-09-13

Test apparatus and test method for A/D converter

#27
20120098687
2012-04-26

Method and apparatus for self-testing a digital-to-analog converter (DAC) in an integrated circuit

#28
20120098557
2012-04-26

Capacitive input test method

#29
20120075130
2012-03-29

Method of testing digital-to-analog and analog-to-digital converters

#30
20120062401
2012-03-15

On-die digital-to-analog conversion testing

#31
20110241914
2011-10-06

Test system and method for analog-to-digital converter

#32
20110231153
2011-09-22

ADC testing

#33
20110227769
2011-09-22

Method for testing a high-speed digital to analog converter based on an undersampling technique

#34
20110227767
2011-09-22

Compensating for harmonic distortion in an instrument channel

#35
20110178757
2011-07-21

ERROR ASSESSMENT METHOD FOR TEST STIMULUS SIGNAL OF ANALOG TO DIGITAL CONVERTER

#36
20110169671
2011-07-14

Method for testing nonlinearity error of high speed digital-to-analog converter

#37
20110137604
2011-06-09

Real-time adaptive hybrid BiST solution for low-cost and low-resource ate production testing of analog-to-digital converters

#38
20110043394
2011-02-24

Successive approximation analog-to-digital converter

#39
20110022341
2011-01-27

Measurement apparatus, program, recording medium, and measurement method

#40
20110012617
2011-01-20

Methods and systems for testing digital-to-analog converter/amplifier circuits

#41
20110007795
2011-01-13

Compressed sensing characterization system and method

#42
20100253559
2010-10-07

Methods and apparatus for built in self test of analog-to-digital convertors

#43
20100182299
2010-07-22

Semiconductor integrated circuit, liquid crystal driver circuit, and liquid crystal display apparatus

#44
20100156681
2010-06-24

Method and module with analog-to-digital converter

#45
20100149007
2010-06-17

Electronic control unit having analog input signal

#46
20100103006
2010-04-29

ADC TEST CIRCUIT AND SEMICONDUCTOR DEVICE

#47
20100102868
2010-04-29

Hardware and method to test phase linearity of phase synthesizer

#48
20100014607
2010-01-21

AD converter, data receiver and data reception method

#49
20090206864
2009-08-20

On-chip servo loop integrated circuit system test circuitry and method

#50
20090109072
2009-04-30

Testing of analog to digital converters

#51
20090105992
2009-04-23

Histogram generation with configurable memory

#52
20090043522
2009-02-12

System and method for distortion analysis

#53
20090040199
2009-02-12

Apparatus for testing driving circuit for display

#54
20090040083
2009-02-12

Analog-to-digital converter

#55
20090039920
2009-02-12

System and method for mapping system transfer functions

#56
20090033528
2009-02-05

Test apparatus, manufacturing method, and test method

#57
20080158028
2008-07-03

Signal converting apparatus with built-in self test

#58
20080106451
2008-05-08

On die thermal sensor having analog-to-digital converter for use in semiconductor memory device

#59
20080007440
2008-01-10

Semiconductor device

#60
20070046509
2007-03-01

Method for digitally representing an integral non-linearity response for a device

#61
20060261990
2006-11-23

Circuit and method for testing analog-digital converter

#62
20060214828
2006-09-28

Testing apparatus

#63
20060170575
2006-08-03

Digital test apparatus for testing analog semiconductor device(s)

#64
20060001560
2006-01-05

Scheme and method for testing Analog-to-Digital converters

#65
20050270940
2005-12-08

Statistical circuit

#66
20050182591
2005-08-18

Encoder and control apparatus for motor

#67
20050116847
2005-06-02

Calibrating capacitor mismatch in a pipeline ADC

#68
20050116846
2005-06-02

A/D converter with minimized transfer error

#69
20050093723
2005-05-05

Built-in-self-test apparatus and method for analog-to-digital converter

#70
20050071829
2005-03-31

Diagnostic compiler for pipeline analog-to-digital converter, method of compiling and test system employing the same

#71
20050068210
2005-03-31

Apparatus and method for measuring data converter

#72
15853143
2018-11-06

Circuit including calibration for offset voltage compensation