ClassID:

241736

Y10S430/128 - CPC Classification

Classification description:

Radiation imagery chemistry: process, composition, or product thereof; Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing; Radiation sensitive composition or product or process of making Radiation-activated cross-linking agent containing

Recent Application in this class:
#1
20140212810
2014-07-31

Negative resist composition and patterning process

#2
20140141372
2014-05-22

Photosensitive polymer, resist composition including the photosensitive polymer and method of preparing resist pattern using the resist composition

#3
20140080055
2014-03-20

Chemically amplified resist composition and patterning process

#4
20140072916
2014-03-13

Hybrid photoresist composition and pattern forming method using thereof

#5
20140065543
2014-03-06

Compound, photosensitive composition comprising the same and photosensitive material

#6
20140004712
2014-01-02

Developable bottom antireflective coating composition and pattern forming method using thereof

#7
20130280658
2013-10-24

Radiation-sensitive composition, and compound

#8
20130202999
2013-08-08

Pattern forming method, chemical amplification resist composition and resist film

#9
20130160939
2013-06-27

Film, method for manufacturing the film and masking method using the film

#10
20130122421
2013-05-16

Hybrid photoresist composition and pattern forming method using thereof

#11
20130004740
2013-01-03

Actinic-ray-sensitive or radiation-sensitive resin composition, resist film and pattern forming method each using the composition, method for preparing electronic device, and electronic device

#12
20120288691
2012-11-15

Pattern forming method, pattern, chemical amplification resist composition and resist film

#13
20120264057
2012-10-18

Patterning process and photoresist with a photodegradable base

#14
20120183893
2012-07-19

Resist composition and patterning process

#15
20120183892
2012-07-19

Resist composition and patterning process

#16
20110059396
2011-03-10

Patterning process and chemical amplified photoresist with a photodegradable base

#17
20100305248
2010-12-02

Resist pattern thickening material and process for forming resist pattern, and semiconductor device and process for producing the same

#18
20100193841
2010-08-05

Method for forming resist pattern and method for manufacturing a semiconductor device

#19
20100080963
2010-04-01

Photosensitive resin composition, polymer compound, method of forming a pattern, and electronic device

#20
20100062379
2010-03-11

Method of forming resist pattern

#21
20100055611
2010-03-04

Resist composition and method for forming a pattern using the same

#22
20100035177
2010-02-11

Method for forming pattern, and material for forming coating film

#23
20100022092
2010-01-28

Method of producing semiconductor device using resist underlayer film by photo-crosslinking curing

#24
20100009299
2010-01-14

Resist composition and patterning process

#25
20090297784
2009-12-03

Photosensitive hardmask for microlithography

#26
20090203224
2009-08-13

Si device making method by using a novel material for packing and unpacking process

#27
20090197199
2009-08-06

Material for forming resist protective film and method for forming resist pattern using same

#28
20090162796
2009-06-25

Methods of forming a pattern of a semiconductor device

#29
20090162785
2009-06-25

Polymer compound, negative resist composition, and method of forming resist pattern

#30
20090104571
2009-04-23

Method for air gap formation using UV-decomposable materials

#31
20090081593
2009-03-26

Method for forming resist pattern and method for manufacturing a semiconductor device

#32
20090042127
2009-02-12

Photoresist composition and method of forming a photoresist pattern using the same

#33
20090011361
2009-01-08

Amine-arresting additives for materials used in photolithographic processes

#34
20080318158
2008-12-25

Underlayer coating forming composition for lithography containing polysilane compound

#35
20080033090
2008-02-07

Flame retardant multi-layer photoimagable coverlay compositions and methods relating thereto

#36
20070275320
2007-11-29

Chemically amplified photoresist composition, laminated product, and connection element

#37
20070248896
2007-10-25

Photoresist formulation for high aspect ratio plating

#38
20070141511
2007-06-21

Cyclic compound, photoresist composition and method of forming a photoresist pattern using the same

#39
20070020559
2007-01-25

Positive-type photosensitive resin composition and cured film manufactured therefrom

#40
20060267223
2006-11-30

Plastic materials including dendrimers or hyperbranched polymers for integrated circuit packaging

#41
20060166139
2006-07-27

Organic anti-reflective coating composition and method for forming photoresist patterns using the same

#42
20060141394
2006-06-29

Photoresist formulation for high aspect ratio plating

#43
20060073419
2006-04-06

Resist pattern thickening material and process for forming resist pattern, and semiconductor device and process for producing the same

#44
20060068526
2006-03-30

Acrylic polymer-containing gap fill material forming composition for lithography

#45
20060068321
2006-03-30

Planographic printing plate precursor

#46
20050277056
2005-12-15

Photoresist composition and method of forming a pattern using the same

#47
20050238997
2005-10-27

Thermally cured undercoat for lithographic application

#48
20050196702
2005-09-08

Methods for photopatterning hydrogels

#49
20050164507
2005-07-28

Negative photoresist composition including non-crosslinking chemistry

#50
20050075247
2005-04-07

Polymerizable composition and image recording material containing the same

#51
20050058930
2005-03-17

Negative resist composition with fluorosulfonamide-containing polymer

#52
20050026079
2005-02-03

Recording medium