ClassID:

241759

Y10S430/151 - CPC Classification

Classification description:

Radiation imagery chemistry: process, composition, or product thereof Matting or other surface reflectivity altering material

Recent Application in this class:
#1
20100159391
2010-06-24

Photosensitive paste and process for production of pattern using the same

#2
20100040988
2010-02-18

SPIN BOWL COMPATIBLE POLYAMIC ACIDS/IMIDES AS WET DEVELOPABLE POLYMER BINDERS FOR ANTI-REFLECTIVE COATINGS

#3
20100025715
2010-02-04

Ultra dark polymer

#4
20090297784
2009-12-03

Photosensitive hardmask for microlithography

#5
20090291392
2009-11-26

Wet developable bottom antireflective coating composition and method for use thereof

#6
20090203206
2009-08-13

Fabrication of semiconductor devices using anti-reflective coatings

#7
20090197203
2009-08-06

Photosensitive conductive paste for transferring and photosensitive transfer sheet

#8
20090111057
2009-04-30

Photoimageable branched polymer

#9
20090111048
2009-04-30

Alkali-developable black photosensitive resin composition for forming light-shielding barrier wall

#10
20080193875
2008-08-14

Composite photoresist structure

#11
20080185291
2008-08-07

Laser patterning method for fabricating disc stamper

#12
20080090178
2008-04-17

Heat-sensitive transfer image-receiving sheet and coating composition for forming heat-sensitive transfer image-receiving sheet

#13
20080081765
2008-04-03

Heat-sensitive transfer image-receiving sheet and coating composition for forming heat-sensitive transfer image-receiving sheet

#14
20070243484
2007-10-18

Wet developable bottom antireflective coating composition and method for use thereof

#15
20070238207
2007-10-11

Semiconductor constructions

#16
20070202447
2007-08-30

Silver salt photothermographic dry imaging material and image forming method by use thereof

#17
20070178416
2007-08-02

Photothermographic material

#18
20070148602
2007-06-28

Method for manufacturing semiconductor device

#19
20070141516
2007-06-21

Ultra dark polymer

#20
20070122742
2007-05-31

Photocurable and thermosetting resin composition, dry film using the same, and cured product thereof

#21
20070105363
2007-05-10

Antireflective hardmask and uses thereof

#22
20070105059
2007-05-10

Image forming method using photothermographic material

#23
20070102397
2007-05-10

Method for printing contacts on a substrate

#24
20070072130
2007-03-29

Process for fabricating micro-display

#25
20070054205
2007-03-08

Process for forming anti-reflection coating and method for improving accuracy of overlay measurement and alignment

#26
20070032054
2007-02-08

Semiconductor substrate process using a low temperature deposited carbon-containing hard mask

#27
20060286486
2006-12-21

Method of fabricating a semiconductor device

#28
20060240367
2006-10-26

Silver salt photothermographic dry imaging material

#29
20060228644
2006-10-12

Nanocomposite photoresist composition for imaging thick films

#30
20060220186
2006-10-05

Semiconductor constructions

#31
20060216657
2006-09-28

Image forming method using photothermographic material

#32
20060199397
2006-09-07

Fabrication of semiconductor devices using anti-reflective coatings

#33
20060199103
2006-09-07

Process for producing an image using a first minimum bottom antireflective coating composition

#34
20060189147
2006-08-24

Pattern forming method and semiconductor device manufacturing method

#35
20060183050
2006-08-17

Process for forming an ultra fine pattern using a bottom anti-reflective coating film containing an acid generator

#36
20060177774
2006-08-10

Process of imaging a photoresist with multiple antireflective coatings

#37
20060160018
2006-07-20

Electrode-forming composition for field emission type of display device, and method using such a composition

#38
20060127804
2006-06-15

Photoacid generating polymer, its preparation method, top anti-reflective coating composition comprising the same, method of forming a pattern in a semiconductor device, and semiconductor device

#39
20060110685
2006-05-25

Apparatus and method to improve resist line roughness in semiconductor wafer processing

#40
20060073426
2006-04-06

Method for simulating spot varnish on a surprint proof

#41
20060063113
2006-03-23

Antireflection film, polarizing plate and display device

#42
20060063106
2006-03-23

Spin bowl compatible polyamic acids/imides as wet developable polymer binders for anti-reflective coatings

#43
20060038262
2006-02-23

Semiconductor devices having antireflective material

#44
20050250330
2005-11-10

Method utilizing compensation features in semiconductor processing

#45
20050250057
2005-11-10

Image forming method using photothermographic material

#46
20050245088
2005-11-03

Method for BARC over-etch time adjust with real-time process feedback

#47
20050191832
2005-09-01

Approach to improve line end shortening including simultaneous trimming of photosensitive layer and hardmask

#48
20050175927
2005-08-11

Composition for forming anti-reflective coat

#49
20050170298
2005-08-04

Heat-developable photosensitive material and an image forming method

#50
20050123872
2005-06-09

Method for chemical sensitization of silver halide for photothermographic use

#51
20050123871
2005-06-09

Method for chemical sensitization of silver halide for photothermographic use

#52
20050084810
2005-04-21

Highly lubricated imaging element with elastomeric matte

#53
20050042538
2005-02-24

Antireflective hardmask and uses thereof

#54
20050020055
2005-01-27

Semiconductor processing methods

#55
20050014094
2005-01-20

Organic anti-reflective coating composition and pattern forming method using the same