Dietmar LERCHE

City:

Berlin

Country:

Germany

Published Applications:

Last publication date:

2022-10-20

Top Assignees for applications by Dietmar LERCHE

The entities that hold a legal rights for patent applications filed by inventor LERCHE Dietmar:

L.U.M. GmbH 4 Berlin, Germany
Dr. Lerche KG 2 Berlin, Germany
HUMBOLDT-UNIVERSITAET ZU BERLIN 1 BERLIN, Germany
L.U.M. GESELLSCHAFT FÜR, LABOR UMWELTDIAGNOSTIC & MEDISINTECHNIC mbH 1 Berlin, Germany
L.U.M. Gesellschaft fur Labor-Umweltdiagnostic & Medizintechnik mbH 1 Berlin, Germany
L.U.M. GESELLSCHAFT FUR LABOR- UMWEL TDIAGNOSTIC & MEDIZINITECHNIK mbH 1 Berlin, Germany

Recent patent applications by LERCHE Dietmar

Dietmar LERCHE from Berlin, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-10-20

US20220334047A1

Physics

METHOD AND DEVICE FOR DETERMINING FEATURES OF PARTICLES BY MULTIPARAMETRIC CAPTURE OF SCATTERED LIGHT AND EXTINCTION SIGNALS

#2 | 2021-01-14

US20210010910A1

Physics

CENTRIFUGE ROTOR COMPRISING AN ON-BOARD MEASUREMENT DEVICE

#3 | 2014-12-18

US20140371047A1

Physics

CENTRIFUGE ROTOR

#4 | 2012-11-22

US20120293799A1

Physics

Method and device for the characterization of multiple samples of one or various dispersions

#5 | 2011-11-17

US20110282590A9

Physics

Determining particle properties by means of superimposed fields

#6 | 2011-08-25

US20110207163A1

Physics

METHOD FOR AND MATERIAL OF A SHAPE STANDARD

#7 | 2011-04-28

US20110098462A1

Chemistry; metallurgy

METHOD AND KIT FOR THE SAMPLE PRESERVATION AND CELL DISRUPTION BEFORE THE EXTRACTION OF NUCLEIC ACIDS

#8 | 2010-08-05

US20100198523A1

Physics

DETERMINING PARTICLE PROPERTIES BY MEANS OF SUPERIMPOSED FIELDS

#9 | 2008-02-21

US20080046193A1

Physics

Method and device for characterisation of multiple samples of one or various dispersions

#10 | 2005-07-28

US20050161112A1

Physics

Automatic sample collector

InventorID:

1007261 ⎘