Daisuke OHGARANE

City:

Hadano

Country:

Japan

Published Applications:

Last publication date:

2015-01-08

Top Assignees for applications by Daisuke OHGARANE

The entities that hold a legal rights for patent applications filed by inventor OHGARANE Daisuke:

Daisuke OHGARANE from Hadano, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Transmission electron diffraction measurement apparatus and method for measuring transmission electron diffraction pattern

Thin film transistor with metal silicide layer

Manufacturing method for thin film transistor on insulator

Method for manufacturing semiconductor device

InventorID:

1026734 ⎘