Chahn Lee

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2022-04-21

Top Assignees for applications by Chahn Lee

The entities that hold a legal rights for patent applications filed by inventor Lee Chahn:

HITACHI HIGH-TECHNOLOGIES CORPORATION 5 Tokyo, Japan
HITACHI HIGH-TECH CORPORATION 4 Tokyo, Japan

Recent patent applications by Lee Chahn

Chahn Lee from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-04-21

US20220122804A1

Electricity

Charged particle beam device

#2 | 2020-10-01

US20200312615A1

Electricity

Charged particle beam device

#3 | 2020-09-17

US20200294756A1

Electricity

Charged particle ray device and cross-sectional shape estimation program

#4 | 2019-06-13

US20190180979A1

Electricity

Charged particle beam device

#5 | 2019-04-04

US20190103250A1

Electricity

Charged Particle Beam Device

#6 | 2018-06-28

US20180182595A1

Electricity

Charged particle beam device and pattern measurement device

#7 | 2017-09-28

US20170278671A1

Electricity

Charged particle beam device

#8 | 2016-08-18

US20160240348A1

Electricity

Charged particle beam device

#9 | 2015-12-10

US20150357154A1

Electricity

Charged particle beam device

#10 | 2015-01-08

US20150008322A1

Electricity

Scanning electron microscope

InventorID:

1026735 ⎘