Inventor profile of:

Doug Weiser

City:

Plano, Texas

Country:

United States

Published Applications:

16

Last publication date:

2026-04-02

Top Assignees for applications by Doug Weiser

The entities that hold a legal rights for patent applications filed by inventor Weiser Doug:

Recent patent applications by Weiser Doug

Doug Weiser from Plano, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-04-02
US20260096187A1
Electricity

JUNCTION DIODE ISOLATION

#2 | 2025-03-06
US20250081449A1
Electricity

ASYMMETRICAL CHANNEL FLOATING GATE THREE-STATE ONE-TIME PROGRAMMABLE NONVOLATILE MEMORY

#3 | 2024-12-05
US20240405125A1
Electricity

BURIED CHANNEL SEMICONDUCTOR DEVICE INCLUDING ENERGY BARRIER MODULATION REGION(S)

#4 | 2020-12-24
US20200403061A1
Electricity

Method and structure for dual sheet resistance trimmable thin film resistors

#5 | 2020-07-09
US20200219977A1
Electricity

High voltage demos transistor with improved threshold voltage matching

#6 | 2019-10-10
US20190311959A1
Electricity

High density wafer level test module

#7 | 2019-07-04
US20190206996A1
Electricity

High voltage DEMOS transistor with improved threshold voltage matching

#8 | 2019-01-17
US20190019884A1
Electricity

Integrated JFET structure with implanted backgate

#9 | 2019-01-03
US20190006511A1
Electricity

Programmable non-volatile memory with low off current

#10 | 2018-09-13
US20180261664A1
Electricity

Method and structure for dual sheet resistance trimmable thin film resistors

#11 | 2018-01-18
US20180019297A1
Electricity

Method and structure for dual sheet resistance trimmable thin film resistors at same level

#12 | 2017-12-28
US20170373171A1
Electricity

Integrated JFET structure with implanted backgate

#13 | 2016-11-03
US20160322511A1
Electricity

Silicon IMPATT diode

#14 | 2015-01-22
US20150021740A1
Electricity

Integration of the silicon IMPATT diode in an analog technology

#15 | 2011-03-03
US20110050275A1
Physics

Semiconductor wafer having test modules including pin matrix selectable test devices

#16 | 2005-06-09
US20050124079A1
Electricity

Modeling process for integrated circuit film resistors

InventorID:

1041404 ⎘