Berkeley, California
United States
8
2020-07-30
The entities that hold a legal rights for patent applications filed by inventor Hill Andrew:
Andrew Hill from Berkeley, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Systems and methods for optimizing focus for imaging-based overlay metrology
#2 | 2019-07-25On the fly target acquisition
#3 | 2018-10-11Systems and methods for optimizing focus for imaging-based overlay metrology
#4 | 2018-01-04Scatterometry system and method for generating non-overlapping and non-truncated diffraction images
#5 | 2016-02-18Image acquisition system, image acquisition method, and inspection system
#6 | 2016-01-28Compressive sensing with illumination patterning
#7 | 2015-04-30Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
#8 | 2015-01-22Scatterometry system and method for generating non-overlapping and non-truncated diffraction images
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