Hidehiro WATANABE

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2015-02-12

Top Assignees for applications by Hidehiro WATANABE

The entities that hold a legal rights for patent applications filed by inventor WATANABE Hidehiro:

KABUSHIKI KAISHA TOSHIBA 1 Kawasaki, Japan
Kabushiki Kaisha Toshiba 1 Tokyo, Japan
Toshiba Tec Kabushiki Kaisha 1 Tokyo, Japan

Recent patent applications by WATANABE Hidehiro

Hidehiro WATANABE from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2015-02-12

US20150041645A1

Electricity

IMAGE ACQUISITION APPARATUS, IMAGE ACQUISITION METHOD AND DEFECT INSPECTION APPARATUS

#2 | 2010-09-23

US20100237469A1

Electricity

PHOTOMASK, SEMICONDUCTOR DEVICE, AND CHARGED BEAM WRITING APPARATUS

#3 | 2006-12-05

US10100626

Image processing method

#4 | 2005-09-20

US10607976

Substrate cleaning method and substrate cleaning apparatus

#5 | 2005-08-04

US20050169513A1

Physics

Reference data generating method, pattern defect checking apparatus, pattern defect checking method, reference data generating program, and semiconductor device manufacturing method

InventorID:

1063114 ⎘