Jun HIROTA

City:

Kanagawa

Country:

Japan

Published Applications:

Last publication date:

2017-09-21

Top Assignees for applications by Jun HIROTA

The entities that hold a legal rights for patent applications filed by inventor HIROTA Jun:

Jun HIROTA from Kanagawa, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Scanning probe microscope and measurement method using the same

Measuring method of scanning probe microscopy using penetrative pressing force

Scanning probe microscope

InventorID:

1081993 ⎘