Inventor profile of:

David B. Stone

City:

Jericho, Vermont

Country:

United States

Published Applications:

42

Last publication date:

2020-03-12

Top Assignees for applications by David B. Stone

The entities that hold a legal rights for patent applications filed by inventor Stone David B.:

Recent patent applications by Stone David B.

David B. Stone from Jericho, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2020-03-12
US20200083177A1
Electricity

Shielded package assemblies with integrated capacitor

#2 | 2019-11-28
US20190363047A1
Electricity

FAN-OUT CONNECTIONS OF PROCESSORS ON A PANEL ASSEMBLY

#3 | 2019-09-19
US20190287879A1
Electricity

Interconnected integrated circuit (IC) chip structure and packaging and method of forming same

#4 | 2018-03-08
US20180068957A1
Electricity

Shielded package assemblies with integrated capacitor

#5 | 2017-05-25
US20170148749A1
Electricity

Reduced-warpage laminate structure

#6 | 2017-05-18
US20170141078A1
Electricity

Split ball grid array pad for multi-chip modules

#7 | 2017-05-04
US20170125358A1
Electricity

Shielded package assemblies with integrated capacitor

#8 | 2017-03-16
US20170077000A1
Electricity

Split ball grid array pad for multi-chip modules

#9 | 2016-06-02
US20160157357A1
Electricity

Reduced-warpage laminate structure

#10 | 2016-06-02
US20160155708A1
Electricity

Reduced-warpage laminate structure

#11 | 2015-12-03
US20150349565A1
Electricity

Shielded package assemblies with integrated capacitor

#12 | 2015-09-10
US20150255441A1
Electricity

Thermally enhanced three-dimensional integrated circuit package

#13 | 2015-09-10
US20150255405A1
Electricity

Chamfered corner crackstop for an integrated circuit chip

#14 | 2015-09-03
US20150247896A1
Physics

Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures

#15 | 2015-08-27
US20150245491A1
Electricity

Integrated circuit structures having off-axis in-hole capacitor

#16 | 2015-08-27
US20150243609A1
Electricity

Shielded package assemblies with integrated capacitor

#17 | 2015-07-30
US20150214155A1
Electricity

Packages for three-dimensional die stacks

#18 | 2015-07-23
US20150206835A1
Electricity

Method, structures and method of designing reduced delamination integrated circuits

#19 | 2015-07-09
US20150195914A1
Electricity

Integrated circuit structures having off-axis in-hole capacitor and methods of forming

#20 | 2015-07-09
US20150194364A1
Electricity

Packages for three-dimensional die stacks

#21 | 2015-04-02
US20150091131A1
Electricity

Power distribution for 3D semiconductor package

#22 | 2015-02-12
US20150044787A1
Electricity

Semiconductor test and monitoring structure to detect boundaries of safe effective modulus

#23 | 2015-02-05
US20150033554A1
Electricity

Organic module EMI shielding structures and methods

#24 | 2014-08-14
US20140227874A1
Electricity

Elongated via structures

#25 | 2014-07-31
US20140210059A1
Electricity

Organic module EMI shielding structures and methods

#26 | 2014-01-30
US20140033148A1
Physics

Elastic modulus mapping of a chip carrier in a flip chip package

#27 | 2014-01-23
US20140021622A1
Electricity

Optimization metallization for prevention of dielectric cracking under controlled collapse chip connections

#28 | 2013-11-07
US20130292817A1
Electricity

Structure for monitoring stress induced failures in interlevel dielectric layers of solder bump integrated circuits

#29 | 2013-10-31
US20130285251A1
Electricity

Elongated via structures

#30 | 2013-10-17
US20130270558A1
Electricity

Semiconductor test and monitoring structure to detect boundaries of safe effective modulus

#31 | 2013-04-25
US20130099391A1
Electricity

Chamfered corner crackstop for an integrated circuit chip

#32 | 2013-02-28
US20130049834A1
Electricity

Packaging identical chips in a stacked structure

#33 | 2012-07-26
US20120187953A1
Physics

Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures

#34 | 2012-03-01
US20120049874A1
Physics

Semiconductor test chip device to mimic field thermal mini-cycles to assess reliability

#35 | 2008-06-05
US20080127485A1
Electricity

VENTS WITH SIGNAL IMAGE FOR SIGNAL RETURN PATH

#36 | 2008-04-17
US20080088335A1
Physics

Packaging reliability superchips

#37 | 2007-03-27
US10455982
-

Dual pitch contact pad footprint for flip-chip chips and modules

#38 | 2006-12-28
US20060290372A1
Physics

Packaging reliability super chips

#39 | 2006-09-05
US11159913
-

Packaging reliability superchips

#40 | 2006-05-25
US20060108142A1
Electricity

Vents with signal image for signal return path

#41 | 2006-04-11
US10040745
-

Method of making an electronic package

#42 | 2005-12-20
US10042031
-

Vents with signal image for signal return path

InventorID:

109560 ⎘