MOUNTAIN VIEW, California
United States
17
2020-03-19
The entities that hold a legal rights for patent applications filed by inventor SMITH STEPHEN LEE:
STEPHEN LEE SMITH from MOUNTAIN VIEW, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Mapping intermediate material properties to target properties to screen materials
#2 | 2020-03-19Adaptive parallelization for multi-scale simulation
#3 | 2020-01-02Estimation of effective channel length for FinFETs and nano-wires
#4 | 2019-05-16Atomic scale grid for modeling semiconductor structures and fabrication processes
#5 | 2018-05-24Simulation scaling with DFT and non-DFT
#6 | 2018-04-26Atomic scale grid for modeling semiconductor structures and fabrication processes
#7 | 2017-11-16Parameter extraction of DFT
#8 | 2016-11-17Multi-scale simulation including first principles band structure extraction
#9 | 2016-08-25Estimation of effective channel length for FinFETs and nano-wires
#10 | 2016-08-11First principles design automation tool
#11 | 2016-07-28Parameter extraction of DFT
#12 | 2016-06-09Mapping Intermediate Material Properties To Target Properties To Screen Materials
#13 | 2016-03-10Atomic scale grid for modeling semiconductor structures and fabrication processes
#14 | 2015-03-26Adaptive parallelization for multi-scale simulation
#15 | 2015-03-26Characterizing target material properties based on properties of similar materials
#16 | 2015-03-26Iterative simulation with DFT and non-DFT
#17 | 2015-03-26Simulation scaling with DFT and non-DFT
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