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Inventor profile of:

YU-JUN HE

City:

Beijing

Country:

China

Published Applications:

Last publication date:

2018-09-27

Top Assignees for applications by YU-JUN HE

The entities that hold a legal rights for patent applications filed by inventor HE YU-JUN:

Tsinghua University 16 Beijing, China
HON HAI PRECISION INDUSTRY CO., LTD. 16 New Taipei, Taiwan

Recent patent applications by HE YU-JUN

YU-JUN HE from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2018-09-27

US20180276809A1

Physics

Method for distinguishing semiconducting nanowires from metallic nanowires

#2 | 2016-06-30

US20160188096A1

Physics

Hover controlling device

#3 | 2016-06-30

US20160188095A1

Physics

Hover controlling device

#4 | 2016-06-30

US20160188094A1

Physics

Touch and hover sensing device

#5 | 2016-06-30

US20160188055A1

Physics

Electrostatic sensing device

#6 | 2016-06-30

US20160188054A1

Physics

Electrostatic sensing device

#7 | 2016-06-30

US20160188053A1

Physics

Electrostatic sensing method

#8 | 2016-06-30

US20160188052A1

Physics

Electrostatic sensing device

#9 | 2016-06-30

US20160188051A1

Physics

Electrostatic sensing device

#10 | 2016-06-30

US20160188043A1

Physics

Touch and hover sensing device

#11 | 2016-06-30

US20160187405A1

Physics

Electrostatic distribution measuring instrument

#12 | 2016-06-30

US20160187404A1

Physics

Electrometer

#13 | 2016-06-30

US20160187403A1

Physics

Electrometer

#14 | 2015-09-03

US20150246517A1

Performing operations; transporting

Method for transferring nanostructures

#15 | 2015-09-03

US20150246516A1

Performing operations; transporting

Method for transferring nanostructures

#16 | 2015-04-16

US20150104095A1

Electricity

Method for evaluating bandgap distributions of nanowires

InventorID:

1129152 ⎘